FISCHERSCOPE® X-RAY XDV®-µ PCB
precision even with short measuring times
with smallest spot size 10 µm (FWHM)
for reliable measuring of small structures
¹ Up to 50 % increased performance: Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.
² High-end capillary optics made by Fischer – the world's only manufacturer of X-ray fluorescence measuring instruments with its own polycapillary production. Three different high-end polycapillaries available – the right solution for each of your applications: 10 µm halo-free, 20 µm halo-free or 20 µm halo.
Automated XRF quality control of PCBs.
The FISCHERSCOPE® X-RAY XDV®-µ PCB is a true specialist for reliable quality control of PCBs with X-ray fluorescence. Thanks to a powerful silicon drift detector, microfocus tube Ultra and polycapillary optics, the XRF instrument measures with an extremely small measuring spot at very high intensity. This allows you to reliably determine even the thinnest layers. The devices also meet IPC requirements 4552 and 4556 for ENIG and ENEPIG as well as 4553A (Silver) and 4554 (Tin).
Meeting all challenges.
Reliable and fast results for ambitious measuring tasks
Fully automatable.
Let your instrument work for you
PCB experts.
Specialized measuring solutions for printed circuit boards, fulfill IPC standards
Most advanced polycapillary optics on the market.
Our in-house manufactured polycapillary optics deliver outstanding measurement results in short measuring times
Accurate and precise.
Positioning of the measuring point on small structures thanks to automatic image recognition
Commissioning.
Extremely fast and simple
DPP+ digital pulse processor.
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
PCB instrument series: Specialized measuring solutions for PCBs, conform to IPC 4552 (ENIG), 4556 (ENEPIG), 4553A (Silver) and 4554 (Tin) standards.
Universal instrument for measurements on small structures, multilayers, functional coatings and thin coatings ≤ 3 nm or 10 nm.
With the microfocus tube Ultra, the excitation intensity is significantly increased. This ensures even better measuring performance with smallest measuring spots.
Selecting measurement positions individually can be very time-consuming. Reduce this effort significantly with the implemented image recognition software.
Features
Microfocus tube Ultra with tungsten anode for even higher performance on smallest spots with µ-XRF; Molybdenum anode optional
4-fold changeable filters
Up to 10 mm possible height of samples
Polycapillary optics allow particularly small measuring spots with short measuring times at high intensity
Measuring spot approx.: Ø 10 or 20 µm (FWHM)
High-precision, programmable measuring table for PCBs up to 610 x 610 mm, optionally with vacuum fixture
Silicon drift detector with 20 or 50 mm² for highest precision on thin films
DPP+ for highest precision even with short measuring times
Application examples
- Measuring on smallest flat components and structures on PCBs up to 610 x 610 mm (24 x 24 in)
- Analysis of very thin coatings, such as gold/palladium layers of ≤ 3 nm or 10 nm
- Automated measuring such as in quality control
- With the 10 μm option: Measuring with smallest measuring spot in combination with a large silicon drift detector
- With the vacuum table option: Measuring on flexible PCBs
- Full compliance with IPC standards 4552 and 4556 (ENIG, ENEPIG), 4553A (Silver) and 4554 (Tin)
Do you have further applications? Then contact us!
Application Notes
Tutorials
Webinars
Brochures
Application Notes
AN050 X-ray instruments for standard PCB applications 0.72 MB AN072 Simplifying quality control on PCBs with automatic pattern recognition 0.67 MB AN088 Fast and non-destructive nickel phosphorus analysis for printed circuit boards 2.40 MB AN092 How to choose an XRF instrument 1.29 MB AN105 μ-spot measurements of tin and tin alloy coatings on PCBs 0.82 MBTutorials
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instrumentsFISCHERSCOPE® X-RAY tutorial: Stability testFISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®Webinars
Setting up measurement equipment monitoringSmaller, faster and more precise: Polycapillary optics for challenging applicationsReport documentationBrochures
Fischer Insights.
Discover more products.
