Determination of thin films, trace elements and alloys.

Universal instrument for measuring on smallest structures, very thin multilayer coatings, functional coatings and very thin coatings ≤ 0.1 µm.


Up to 50% ¹ improved
performance thanks to DPP+
Manual adjustable sample table
for fast and easy probe positioning
Adjustment of the measuring distance through
patented DCM method
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¹ Significantly better standard deviation and thus measurement capability or significantly reduced measurement time in comparison DPP to DPP+.

Universal X-ray fluorescence analysis for very thin layers.

The FISCHERSCOPE® X-RAY XDAL® 600 is the universal XRF analyzer from Fischer for the determination of thin layers, trace elements and alloys. With top down measurement, the sample is simply placed on the manually operated shear table. A laser pointer serves as a positioning aid. This means that even samples with complex geometries can be analyzed precisely and easily.


Ideal for electronics and semiconductor industry

RoHS analysis.

Reliable determination of hazardous substances

Quick-measure design.

The sample is placed and ready for measurement in just a few steps


Optimal cost-benefit ratio

DPP+ digital pulse processor.

Shorter measuring times or improvement of standard deviation*

*compared to the DPP

  • Features

      Silicon drift detector 50 mm² with extra-large effective area of 50 mm²

      4-fold changeable apertures and 3-fold changeable filters

      Higher count rates and significantly reduced measurement times thanks to DPP+

      Microfocus tube with tungsten anode

      Up to 140 mm possible height of samples

      Measuring spot approx.: Ø 0.15 mm

  • Application examples

      • Analysis of thin and very thin coatings of ≤ 0.1 µm
      • Measuring functional coatings in the electronics and semiconductor industry, such as on lead frames, plug contacts or PCBs
      • Determination of complex multilayer systems
      • Determination of lead content in solders
      • Determination of phosphorus content in NiP coatings

      Do you have further applications? Then contact us!

Application Notes
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
FISCHERSCOPE® X-RAY tutorial: Stability test
FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
Setting up measurement equipment monitoring
Report documentation

Fischer Insights.

Measuring method.

Learn and discover how the X-ray fluorescence analysis works.

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We offer you everything you need for reliable measurement results.

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Why Fischer.

Experience many good reasons that speak for us as a company.

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