Smallest measuring spot, largest measuring distance.

Mastering demanding measuring tasks with polycapillaries: High-end XRF measuring device with polycapillary X-ray optics for measuring on smallest components with smallest measuring spot and largest measuring distance.


Up to 50% ¹ increased
performance thanks to DPP+
60 µm
smallest spot size
12 mm
largest measurement distance - best in class!
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¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.

Performance at its best.

The highlight for complex shaped small test parts. The unparalleled measuring distance combined with the smallest measuring spot and microfokus tube Ultra for higher performance with smallest measuring sports make the FISCHERSCOPE® X-RAY XDV®-μ LD the industry-leading XRF instrument.

Meeting all challenges.

Reliable and fast results for ambitious measurement

Most advanced polycapillary optics on the market.

Our in-house manufactured polycapillary optics deliver outstanding measurement results with short measuring times

Accurate and precise.

Positioning of the measuring point on small structures thanks to automatic image recognition

Fully automatable.

Let your instrument work for you with just one click

DPP+ digital pulse processor.

Shorter measuring times or improvement of standard deviation*

*compared to the DPP

  • Features

      Microfocus tube Ultra with tungsten anode for even higher performance on smallest spots with µ-XRF; Molybdenum anode optional

      Changeable filter

      Higher count rates and significantly reduced measurement times thanks to DPP+

      Polycapillary optics allow particularly small measuring spots with short measuring times with high intensity

      Measuring spot approx.: Ø 60 µm

      Determination of metal content in electroplating baths with corresponding accessories

      Silicon drift detector with 20 or 50 mm² active area for highest precision with thin layers

      Up to 135 mm possible height of samples

  • Application examples

      • Measuring on smallest components and structures like assembled and complex shaped PCBs, plug contacts, bonding areas, SMD components or thin wires
      • Measuring of functional layers in the electronics and semiconductor industry
      • Determination of complex multilayer systems
      • Automated measuring, such as in quality control

      Do you have further applications? Then contact us!

Application Notes
Product videos
Technical articles
FISCHERSCOPE® X-RAY XDV® series: Up to 50% improved performance
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
FISCHERSCOPE® X-RAY tutorial: Stability test
FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
Setting up measurement equipment monitoring
Smaller, faster and more precise: Polycapillary optics for challenging applications
Report documentation

Fischer Insights.

Measuring method.

Learn and discover how the X-ray fluorescence analysis works.

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We offer you everything you need for reliable measurement results.

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Experience many good reasons that speak for us as a company.

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