The best detectors for thin layers.

Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.


Adjustment of the measuring distance through
patented DCM method
Type approved
full protection device

X-ray fluorescence analysis for higher demands.

Thin, thinner, XDAL®: Thanks to the microfocus tube and various semiconductor detectors, the FISCHERSCOPE® X-RAY XDAL® series is ideal for applications in the field of thin and very thin coatings < 0.05 μm as well as for material analysis in the ppm range. The instrument version with the 50 mm² silicon drift detector is furthermore suitable for RoHS measuring. The flexible and, thanks to various configuration options (table, aperture, filter and detector), universal XDAL® measures reliably, precisely and stands for 100 % safety.


Extremely fast and simple

One device, many possibilities.

Coating thickness measurement, material analysis and trace analysis

Testing of multiple measuring points.

Even with large samples, measuring points are possible on the entire sample surface

Also for large samples.

Hood with C-slot

Fully automatable.

Let your instrument work for you with just one click

Compact design.

Very good compromise between performance and space requirements

  • Features

      Microfocus tube with tungsten anode

      Measuring spot approx.: Ø 0.15 mm

      Silicon PIN and silicon drift detector for very good detection accuracy and high resolution

      3-fold changeable filters

      Type approved full protection device

      Determination of metal content in electroplating baths with corresponding accessories

      4-fold changeable apertures

      Up to 140 mm possible heights of samples

      Various measuring table options

  • Application examples

      • Analysis of thin and very thin coatings of ≤ 0.05 μm
      • Measuring functional coatings in the electronics and semiconductor industry, such as on lead frames, plug contacts or PCBs
      • Determination of complex multilayer systems
      • Automated measurements, such as in quality control
      • Determination of lead content in solders
      • With version SDD (20 mm² or 50 mm²):
        • Determination of phosphorus content in NiP layers
        • Meets ENIG/ENEPIG requirements

      Do you have further applications? Then contact us!

Application Notes
Product videos
Technical articles
FISCHERSCOPE® X-RAY XDAL® 237: Introduction
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
FISCHERSCOPE® X-RAY tutorial: Stability test
FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
Setting up measurement equipment monitoring
Report documentation

Fischer Insights.

Measuring method.

Learn and discover how the X-ray fluorescence analysis works.

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We offer you everything you need for reliable measurement results.

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Why Fischer.

Experience many good reasons that speak for us as a company.

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