FISCHERSCOPE® X-RAY XDL®
patented DCM method
full protection device
measuring window on the market
XRF automation for beginners.
The instruments of the FISCHERSCOPE® X-RAY XDL® series are predestined for measurements in quality assurance, incoming inspection and production monitoring. They are closely related to the XULM® series, with one significant difference: the measuring direction from top down! This means convenient analysis of uneven samples for you as well as the possibility of automated measuring.
Also for large samples.
Hood with C-slot
Built to last.
Robust design for measurement on mass-produced parts
Testing of multiple measuring points.
Even with large samples, measuring points are possible on the entire sample surface
Commissioning.
Extremely fast and simple
Tailor-made.
Different models offer the optimal solution for your application
Quick-measure design.
The sample is placed and ready for measurement in just a few steps
Equipped with WinFTM®, the most powerful software on the market for coating thickness measurement and material analysis using X-ray fluorescence analysis.
The hood with C-slot additionally allows measuring of large and flat samples.
From the flat sample support to the programmable XY-table: The XDL® series leaves nothing to be desired.
On the models with XY-table, a laser pointer as a positioning aid supports fast alignment of the sample to be measured.
The integrated video microscope with zoom and crosshairs makes quick alignment of the sample and precise definition of the measuring point extremely easy.
Features
Standard X-ray tube
Apertures: fixed
Primary filters: fixed
Up to 140 mm possible height of samples
Smallest measuring spot approx.: Ø 0.2 mm
Determination of the metal content in electroplating baths with corresponding accessories
Type approved full protection device
Proportional counter tube detector for short measuring times
Application examples
- Electroplated coatings such as zinc on iron as corrosion protection
- Serial testing of mass-produced parts
- Decorative chromium coatings, e. g. Cr/Ni/Cu/ABS
- All typical chromium coatings, such as Cr(VI) and new ones like Cr(III)
- Measuring of functional gold coatings on PCBs such as Au/Ni/Cu/PCB
- Coatings of connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu
- Determination of the metal content of electroplating baths
Do you have further applications? Then contact us!
Application Notes
Product videos
Tutorials
Webinars
Brochures
Application Notes
AN001 Au/Pd coatings in the nm range on printed circuit boards 0.48 MB AN016 Measurement of Cr/Ni/Cu coatings on plastic substrates 0.21 MB AN042 Analysis of the metallic content of plating solutions 0.64 MB AN092 How to choose an XRF instrument 1.29 MB AN094 XRF analysis with proportional counter tube – These are the advantages 0.36 MBProduct videos
FISCHERSCOPE® X-RAY XDL® 230: IntroductionFISCHERSCOPE® X-RAY XDL® 240: IntroductionTutorials
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instrumentsFISCHERSCOPE® X-RAY tutorial: Stability testFISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®FISCHERSCOPE® X-RAY XDL® 230: With DCM: Easy measurement of complex shaped samplesWebinars
Setting up measurement equipment monitoringZnNi-Fe coating: Measurement of coating, as well as control of the associated bathsReport documentationBrochures
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