FISCHERSCOPE® X-RAY XDV®-SDD
performance thanks to DPP+
changeable apertures
changeable filters
¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.
X-ray fluorescence analysis for universally highest demands.
The FISCHERSCOPE® X-RAY XDV®-SDD is one of the most powerful X-ray fluorescence instruments in the Fischer portfolio. Take your measurement performance to a new level with this premium model: In combination with the in-house developed digital pulse processor DPP+, even higher count rates can now be processed, resulting in reduced measuring times or improved repeatability of your measurement results.
Built to last.
Robust design for particularly high requirements
Fully automatable.
Let your device work for you with just one click
Quick-measure design.
With a few simple steps, the sample is placed and ready for measurement. Automated measurements of many parts are possible
Fast.
Thanks to short measuring times, you save valuable time
RoHS analysis.
Determination of pollutants with high detection accuracy and outstanding performance
DPP+ digital pulse processor.
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
Real-time transmission, evaluation and export of measurement data with WinFTM®, the most powerful application software on the market.
Aperture up to 3 mm: Highest intensity for shortest measuring time even with difficult samples.
Programmable measuring table for automated measurements on small structures.
The FISCHERSCOPE® X-RAY XDV®-SDD is one of the most powerful X-ray fluorescence instruments in the Fischer portfolio.
The high-resolution and high-performance silicon drift detector allows you to measure the thinnest layers precisely and non-destructively.
Features
Microfocus tube with tungsten anode
Silicon drift detector 50 mm² with extra-large effective area of 50 mm²
Determination of metal content in electroplating baths with corresponding accessories
Measuring spot approx.: Ø 0.25 mm
Higher count rates and significantly reduced measurement times thanks to DPP+
Type approved full protection device
Up to 140 mm possible height of samples
4-fold changeable apertures and 6-fold changeable filters
Application examples
- Measuring functional coatings in the electronics and semiconductor industry, e.g. determining the thickness of gold coatings down to 2 nm
- Analysis of thin and very thin coatings in the electronics and semiconductor industry, such as gold/palladium layers of ≤ 0.1 μm
- Determination of complex multilayer systems
- Coating thickness measurement for photovoltaics, fuel cell and battery cell applications
- Trace analyses of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer products
- Analysis and authenticity check of gold and other precious metals and precious metal alloys
- Direct determination of phosphorus content in functional NiP layers
- Determination of the metal content of electroplating baths
Do you have further applications? Then contact us!
Application Notes
Product videos
Tutorials
Webinars
Brochures
Technical articles
Application Notes
AN001 Au/Pd Coatings in the nm Range on Printed Circuit Boards 0.48 MB AN002 Phosphorous Content in Electroless Nickel Directly Measurable 0.52 MB AN003 High repeatability precision and trueness of Au/Pd coating measurements on leadframes 0.69 MB AN004 Determination of harmful substances in very small concentrations – RoHS 0.48 MB AN006 Determination of platinum, rhodium and palladium in automotive catalytic converters 0.58 MB AN021 Trace element analysis in materials for fashion jewellery and accessories 0.51 MB AN073 Analysis of harmful substances in textiles for Oeko-Tex® certification 0.75 MB AN092 How to choose an XRF instrument 1.29 MB AN093 XRF analysis for non-destructive coating thickness measurement in the field of cold forging 0.75 MB AN097 Prior to hallmarking, for high sample volumes or large test parts: Measure gold content quickly and reliably 0.69 MB AN109 Measuring very thin components and foils with the sample stage Zero Background 0.21 MBProduct videos
FISCHERSCOPE® X-RAY XDV®-SDD: IntroductionFISCHERSCOPE® X-RAY XDV® series: Up to 50% improved performanceTutorials
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instrumentsFISCHERSCOPE® X-RAY tutorial: Stability testFISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®Webinars
Setting up measurement equipment monitoringZnNi-Fe coating: Measurement of coating, as well as control of the associated bathsReport documentationBrochures
Technical articles
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