FISCHERSCOPE® X-RAY 5000
Inline measuring with highest precision for thin films.
Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
performance thanks to DPP+
through immovable parts
or in the air
¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.
² Only FISCHERSCOPE® X-RAY 5400.
Continuous and smart quality control.
Designed for maximum uptime, the FISCHERSCOPE® X-RAY 5000 series convinces among other things with a high degree of customization and outstanding measurement performance - non-contact, non-destructive and precise. The devices of this series form modular units, which is why they can be easily installed as pure components in an existing plant.
Easy integration, individually adaptable to your application
Does not break a sweat.
Sample temperatures up to 250 °C (482 °F) thanks to water cooling
DPP+ digital pulse processor.
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
Robust and reliable.
No moving parts
Measuring head with all necessary components in one unit
Can be mounted on vacuum chambers
Ruggedly designed and engineered for 24/7 uninterrupted use, even on hot surfaces.
Versatile and ideal for thin coatings thanks to powerful silicon drift detector and configurable aperture.
Precise and fast inline measuring during the running production process.
Low maintenance and easy to service - measuring head maintenance possible without breaking the vacuum.
Real-time transmission, evaluation and export of measurement data with WinFTM®, the most powerful application software on the market.
Microfocus tube with tungsten anode; molybdenum anode optional
Fixed aperture (configurable up to Ø 11 mm)
For measuring in vacuum or in the air
Optionally with water cooling for sample temperatures up to 250 °C
Silicon drift detector 50 mm² for highest precision
Fixed filter (configurable)
Higher count rates and significantly reduced measurement times thanks to DPP+
Any installation position possible
Remote control and data export via TCP/IP interface
- Measuring thin coatings and low loadings on large-area products and substrates, such as fuel cells, on glass panels and very hot surfaces
- Monitoring the composition and thickness of layers in photovoltaics such as CIGS, CIS, CdTe and CdS
- Measuring thin layers of a few µm on metal strips, metal foils and plastic films
- Process monitoring of sputtering and electroplating equipment
You have further applications? Then contact us!