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Fischer introduces the FISCHERSCOPE® X-RAY XDAL®-PCB

The new member of the Fischer PCB family for precise measurement and analysis of layer thicknesses and layer compositions on printed circuit boards.

With the introduction of the FISCHERSCOPE® X-RAY XDAL®-PCB, Fischer complements their PCB series. Thanks to the combination of multi-collimators and a highly sensitive silicon drift detector (SDD), a higher count rate is achieved, resulting in excellent energy resolution, short measurement times and optimal repeatability. The benchtop device is characterized by its simple operation and is ideally suited for measuring functional layers as well as the smallest components and structures on printed circuit boards.

As a full-range supplier in the field of surface inspection, Fischer is continuously working to tailor its portfolio precisely to the needs of its customers. With its PCB instrument series, the metrology specialist offers users specialized measurement solutions for printed circuit boards. The devices deliver reliable and fast results for simple as well as for ambitious measurement tasks and layer thickness measurement down to the nanometer range. The new XDAL®-PCB ideally complements the PCB series, bridging the gap between the lower-cost entry-level devices, XULM®-PCB and XDLM®-PCB, and the premium XDV®-µ PCB.

The instrument features an electrically interchangeable quad aperture (collimator) and a triple interchangeable primary filter. This creates ideal excitation conditions for each measurement. This means flexibility for a wide range of measurement tasks. Thanks to its powerful silicon drift detector (SDD), it is ideal for more complex measurement tasks and very thin layers. The manually retractable measuring stage allows quick and easy sample positioning. This can additionally be configured with a measuring stage extension or automated.

The XDAL®-PCB is ideally suited for quality assurance in manufacturing and applications such as determining the lead content in solder or the phosphorus content in NiP layers, analyzing the composition of electroplating baths or the typical layer structure on PCBs. Furthermore, the instrument's equipment meets the requirements for the measurement of ENIG and ENEPIG coatings.

When developing the FISCHERSCOPE® X-RAY XDAL®-PCB, special attention was paid to robustness and resistance. Thus, all prerequisites for a long service life under a wide range of conditions in the electronics and semiconductor industry have been created. Like the entire portfolio of the measurement technology specialist Fischer, this device also impresses with its accuracy and long-term stability. This reduces calibration effort and saves time and costs.