The normalization causes an adjustment of the measurement task for current settings or for new current substrates. This has to be conducted in case of modifications of primary filters or anode currents or collimators. It is also necessary, if alloy compositions or substrates of the sample have changed.
You should then choose measuring equipment monitoring. You will check the XRF measurement instrument by remeasuring the calibration standards. In case the correct values are not met, adjustments are necessary.
A reference measurement is a new calibration of the energy axis. This is relevant for the correction of XRF instruments with proportional counter, on the influence of temperature.
In order to check the calibration, it is necessary to remeasure the calibration standards within the menu position 'Product', 'Measure CAL. standards'. If you find there is a deviation, the XRF instrument needs to be recalibrated.
The measuring spot is dependant on the collimator and the measuring distance. Typical values are 30 µm – 3 mm.
Most of our XRF instruments are full protection instruments with a design approval according to the German X-ray Ordinance.
One can measure elements from the atomic number 11 and coating thicknesses from approx. 0.005 µm to 60 µm. This depends on the ambient medium (Air, He, Vacuum), detector, size of measuring spot and the atomic number, and of course the application.
With the export mask one can define, which parameters will be exported and when and where the data will be sent to. The measurement data will then be available as a text file.
Yes, it is possible. There is a rough rule for usage: for proportional counter instruments one may use 2 – 3 foils. For instruments with a PIN/SDD-detector it is possible to use 1 foil.
It depends on usage so the customer can determine by himself. A typical value would be every 1 – 3 years.
This not necessary. You don't need to recertify the plate because the elements are saturation thick and therefore very stable.
The measurement accuracy may vary depending on the measuring application: it’s a function of the measurement time, the measurement spot and the uncertainty of the standards with which the XRF device was calibrated.
Here, a scattering spectrum is required. There’s no need to measure the scattering spectrum; it can be loaded from the menu: General ► Load Spectrum and Evaluate…
Here, WinFTM is asking for the substrate material. Please place and measure the uncoated base material from the calibration standard set and the uncoated base material of the objects being measured. Caution: if the wrong parts are placed on the XRF instrument, this can seriously impact the correctness of the results!
The super software is not activated.
Calibration standards with the ISO 17025 certificate are measured according to a strict procedure as defined by the accreditation bodies; they have less measurement uncertainty than calibration standards with a manufacturer's certificate.
Most probably, the option File ► Print Single Readings has been activated in the menu. In this case, each individual value is sent to the printer buffer; then, once a page is full, it’s printed automatically. Deactivate Print Single Readings and clear the printer buffer.
If single readings in the block were deleted, a dash will appear in the list of measured values. These measurements can be displayed again in the menu Evaluation ► Undelete Reading. However, if all the measured readings of a block or product were deleted, the data cannot be restored.