The following parameters are important for a comparison of measurement values: arithmetical mean value, standard deviation, amount of single measurements.
Without the relevant standard deviation and number of single measuremenents, the mean values cannot be compared with each other in a meaningful manner.
Each physical measuring method is influenced by the parameters of the coatings and the substrate. These parameters are: parts geometry, electrical conductivity, magnetizability, density of the coating, measuring surface etc.
Each time, when these parameters of coatings or substrate have changed, it is necessary to recalibrate the measurement instrument.
No, the calibration on the flat plate causes a systematic measuring error on a curved surface. This means the measuring values will be too large. This is because the instrument rates the measuring signals of the sample (here: the curved object) in such a manner, as if they were from a flat sample.
The accuracy of measuring instruments is ensured by the calibration standards. The calibration must be carried out on real, uncoated samples. Furthermore one must take care to measure on the same measuring positions. It is important to take enough measurements in order to receive a significant mean value.
One checks the calibration by remeasuring the calibration foil on the uncoated sample. It has to be this measuring position, where you measure later on as well. Fischer Base calibration plates are not useful for this purpose.
The normalization causes an adjustment of the measurement task for current settings or for new current substrates. This has to be conducted in case of modifications of primary filters or anode currents or collimators. It is also necessary, if alloy compositions or substrates of the sample have changed.
You should then choose measuring equipment monitoring. You will check the XRF measurement instrument by remeasuring the calibration standards. In case the correct values are not met, adjustments are necessary.
A reference measurement is a new calibration of the energy axis. This is relevant for the correction of XRF instruments with proportional counter, on the influence of temperature.
In order to check the calibration, it is necessary to remeasure the calibration standards within the menu position 'Product', 'Measure CAL. standards'. If you find there is a deviation, the XRF instrument needs to be recalibrated.
It depends on usage so the customer can determine by himself. A typical value would be every 1 – 3 years.
Yes, it is possible. There is a rough rule for usage: for proportional counter instruments one may use 2 – 3 foils. For instruments with a PIN/SDD-detector it is possible to use 1 foil.
This not necessary. You don't need to recertify the plate because the elements are saturation thick and therefore very stable.