FISCHERSCOPE® X-RAY XDAL® 600
performance thanks to DPP+
for fast and easy probe positioning
patented DCM method
¹ Significantly better standard deviation and thus measurement capability or significantly reduced measurement time in comparison DPP to DPP+.
Universal X-ray fluorescence analysis for very thin layers.
The FISCHERSCOPE® X-RAY XDAL® 600 is the universal XRF analyzer from Fischer for the determination of thin layers, trace elements and alloys. With top down measurement, the sample is simply placed on the manually operated shear table. A laser pointer serves as a positioning aid. This means that even samples with complex geometries can be analyzed precisely and easily.
Versatile.
Ideal for electronics and semiconductor industry
RoHS analysis.
Reliable determination of hazardous substances
Quick-measure design.
The sample is placed and ready for measurement in just a few steps
Balanced.
Optimal cost-benefit ratio
DPP+ digital pulse processor.
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
Real-time transmission, evaluation and export of measurement data with WinFTM®, the most powerful application software on the market.
Precise and fast trace analysis for consumer protection, such as lead content in toys.
Versatile and ideal for even higher resolution thanks to powerful Silicon drift detector and configurable aperture.
Highest flexibility for a wide range of measuring: 4 different apertures and 3 different filters.
Features
Silicon drift detector 50 mm² with extra-large effective area of 50 mm²
4-fold changeable apertures and 3-fold changeable filters
Higher count rates and significantly reduced measurement times thanks to DPP+
Microfocus tube with tungsten anode
Up to 140 mm possible height of samples
Measuring spot approx.: Ø 0.15 mm
Application examples
- Analysis of thin and very thin coatings of ≤ 0.1 µm
- Measuring functional coatings in the electronics and semiconductor industry, such as on lead frames, plug contacts or PCBs
- Determination of complex multilayer systems
- Determination of lead content in solders
- Determination of phosphorus content in NiP coatings
Do you have further applications? Then contact us!
Application Notes
Tutorials
Webinars
Brochures
Application Notes
Tutorials
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instrumentsFISCHERSCOPE® X-RAY tutorial: Stability testFISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®Webinars
Setting up measurement equipment monitoringReport documentationBrochures
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