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  • Continuous measurement in running processes with connection to production control systems
  • Flexible use: for measurements in vacuum or in air; for sample temperatures up to 400ยฐC
  • Optionally available with water cooling
  • Particularly robust design and construction for sustainably precise measurements under harsh conditions
  • Outstandingly well-suited to coating thickness measurement and material analysis on products with large surfaces
  • X-ray source, detector and primary filter can all be selected by the customer
  • Systems comply with DIN ISO 3497 and ASTM B 568


  • Thickness of CIGS, CIS, CdTe and CdS layers in the solar industry
  • Thin layers just a few ยตm thick on metal strips, metallic foils and plastic foils
  • Composition of CIGS, CIS, CdTe and CdS layers in photovoltaics
  • Coating thickness control in continuous production
  • Process monitoring in sputter and electroplating plants

The automated XRF system for photovoltaics

The FISCHERSCOPEยฎ X-RAY 5000 system continuously measures the layer thickness of thin layers on large-area substrates, for example in photovoltaics. The devices in this series form modular units that are easy to install in production lines. The X-RAY 5000 can be operated either in normal atmosphere or under vacuum. Furthermore, the XRF device is designed to be easy to maintain: the measuring head can be serviced without having to release the vacuum.

If the product moves or bulges during fabrication, it can skew the measuring results. For this reason, Fischerโ€™s WinFTM software also has a built-in function for distance compensation, which can compensate for fluctuations of up to 1 cm without requiring additional distance sensors.


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