The measurement technology specialist Helmut Fischer GmbH is launching a new, universally applicable X-ray fluorescence spectrometer. The benchtop instrument is easy to operate and impresses with its compact, practical design. Nevertheless, it offers the usual precision components for X-ray fluorescence measurements.
As a full-range supplier in the field of surface inspection, Fischer continues to serve the userβs needs precisely. The Fischerscope X-ray XDAL 600 is designed as easy-touse X-ray fluorescence (XRF) benchtop instrument for coating thickness measurement and material analysis. It features a compact, practical design, including the standard precision measurement components.
With this XRF spectrometer, extremely thin layers can be measured precisely, quickly, and non-destructively. XRF analysis of layers with complex composition or small concentration values is also possible.
The measuring instrument has an electrically interchangeable 4-fold aperture as well as a 3-fold interchangeable primary filter. This creates ideal excitation conditions for every measurement, which means: flexibility for a wide range of measurement tasks. The manually adjustable sample table (scissor table) allows fast, easy sample positioning. Besides, the XRF instrument is equipped with the in-house developed digital pulse processor DPP+ as standard. The DPP+ was successfully established last year for processing higher count rates. In practice, this allows higher measurement precision and shorter measurement times.
During the development of the Fischerscope X-ray XDAL 600, special attention was paid to robustness and resistance. Thus, all prerequisites for a long service life under various conditions, e.g. in electroplating and production, have been created. Like the entire portfolio of the measurement technology specialist Fischer, the instrument impresses with its accuracy and long-term stability. This reduces the calibration effort and saves time and costs.