Do you need to determine the content of heavy metals and other harmful substances in electronic components – quickly and non-destructively? If so, Fischer offers reliable measurement devices to detect the smallest concentrations of harmful substances. Thus, you can easily fulfil the requirements of iindustry standards such as RoHs, WEEE, EOLV or CPSIA for electronic components.
- To the product: XRF Film Thickness Measurement, XDV SDD XRF Film Thickness Measurement, XDV SDD
- To the product: FISCHERSCOPE X-RAY XDL and XDLM FISCHERSCOPE X-RAY XDL and XDLM
- To the product: FISCHERSCOPE X-RAY XDAL FISCHERSCOPE X-RAY XDAL