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Fischer Marketing Team | 01. February 2019

Fast and Non-Destructive Analysis

If the sample canโ€™t go to the instrument, the instrument must come to the sample! With its FISCHERSCOPEยฎ X-RAY XANยฎ 500, Fischer offers a mobile X-ray fluorescence (XRF) device optimized for coating thickness measurement and material analysis of alloys.

Despite its small size, the XAN500 is the equal of any XRF instrument one might find in a lab. Its modern silicon drift detector (SDD) guarantees correct measurement results in just a few seconds. And even complex measuring tasks involving multiple layers and various alloys are resolved reliably.

Especially when measuring coating thicknesses, it is of great importance to ensure that the distance between device and sample remains constant and the beam path is straight. The XAN500โ€™s 3-point support allows you to set the device up safely and stably, for accurate measurement of coatings. The result is shown directly on the deviceโ€™s display. For further data evaluation, the XAN500 is equipped with the full WinFTMยฎ software suite.

Coating thickness measurement and material analysis with WinFTM are both based on fundamental parameter analysis. This makes it possible to measure accurately without prior calibration โ€“ that is, standard-free. And for those occasions when only the highest degree of precision will suffice, we also offer DAkkS-certified standards that make calibrating the device for your specific measuring task quick and easy.

Check out the video below to learn more or contact us for more information!

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