Unmatched speed and accuracy
For anyone who values high-precision and particularly reliable XRF measurements, Fischer is the right choice. Compared to their previous models, the new FISCHERSCOPE® XDAL®and FISCHERSCOPE® XDV® devices achieve 6 times faster positioning of the Z-axis, 14 times faster autofocus with a focusing time of less than 2 seconds, and 10 times higher resolution.
Equipped with a powerful overview camera and modern multi-zone LED lighting, these devices provide the optimum illumination for the most accurate analyses for all types of surfaces – whether matt, glossy or reflective.
The new benchmark in measuring performance
Making measurements even more efficient while maintaining market-leading accuracy – this has been achieved with these new products. The optimized spacing between X-ray tube, sample and detector ensures maximum intensity output and guarantees consistently high-quality and repeatable measurement results.
"By introducing our new measuring devices FISCHERSCOPE® XDAL® and FISCHERSCOPE® XDV®, paired with the new Fischer software FISIQ® X, we are setting the next milestone for innovative and customer-oriented XRF measuring solutions. The new generation scores with unique features, uncompromising quality and combines excellent measuring performance with efficient workflows for reliable quality assurance in many different industries,” explains Dr. Martin Leibfritz, CEO of the Helmut Fischer Group.
Other useful features such as a device status lighting, an automated measurement hood, and a broad selection of standardized calibration workflows, top off the package.
Reliable all-rounders for a maximum range of applications
As high-performers, these new devices span an outstanding wide range of different applications. While the FISCHERSCOPE® XDAL® is geared towards the electroplating, coating and PCB industries, among others, the FISCHERSCOPE® XDV® serves applications in branches such as semiconductor, energy, automotive, banking and customs, hallmarking, jewelry and watches.
Time to shine – This is what the future of XRF software looks like
The new device generation is accompanied by a completely new software solution. With FISIQ® X, the Helmut Fischer Group has launched the first and only XRF software with AI-supported spectrum mode to the market. Thanks to improved algorithms, it calculates the measuring results up to 6 times faster for coating thickness measurement and up to 13 times faster for material analysis.
The modern and intuitive user interface offers a completely new user experience and ensures that even inexperienced users will always receive the best possible support for easy measurements.
For more information, please visit glow-up.helmut-fischer.com and fisiq-x.helmut-fischer.com.
