Ready for the future? Discover more about advanced quality control of connectors!
The new FISCHERSCOPE® generation delivers greater speed and maximum accuracy for coating thickness measurement and material analysis
From industrial automation and automotive applications to defense and aerospace, connectors are used in countless electronic systems and must deliver reliable performance. At the same time, the trend toward increasingly compact electronic designs is driving the development of smaller and more delicate connectors. This creates new challenges for quality control and requires measuring solutions that deliver greater precision while improving efficiency.
With the powerful FISCHERSCOPE® XDAL® from our latest XRF instrument generation and the advanced FISIQ® X software, you can analyze your connectors faster, more reliably, and with greater accuracy than ever before. Thanks to interchangeable slit collimators, the measurement spot can be precisely matched to your sample geometry, even for connectors with widths below 300 µm, ensuring excellent intensity yields.
In this Application Note you will learn, among other things:
- why conventional X-ray fluorescence instruments may not provide reliable results when measuring narrow connectors
- how to significantly improve measurement accuracy in connector quality control
- how to achieve highly precise coating thickness measurements in the shortest possible measurement time using AuCo/Ni-coated connectors as an example
- how to measure both coating thickness and material composition in a single measurement using AuCo/Ni-coated connectors as an example
- what benefits FISIQ® X has to offer
