Check out our new FISCHERSCOPE® XDAL® and XDV®, together with the cutting-edge FISIQ® X software. Learn more!

Fischer FAQ

Any questions?

There is a lot to tell, and you are sure to have questions, as well. Here are the most common ones. If you need more answers, just contact us. We will be glad to help you.

You will also find many interesting tutorials and other useful information in our media library.

FAQ Important parameters

  • Mean value

      The simplest way to calculate a mean value is to add up all values and divide this sum by the number of values. This is called the arithmetic mean. There are other ways to calculate a mean, but they are rarely used.

  • Range

      The range R shows how far apart the smallest and the largest measured value are. To calculate the range, the lowest measured value is subtracted from the largest. The range can be strongly distorted by outliers and is therefore only useful if you have few measured values. For large amounts of data, the standard deviation is more meaningful.

  • Standard deviation

      The standard deviation σ indicates how strongly the measured values scatter around the mean value. A high standard deviation indicates that the measured values differ greatly from one another. If the values are all close to the mean, the standard deviation is small. How well the mean and the standard deviation describe reality depends, among other things, on the number of measured values. The more measurement points, the more meaningful the ratios become.

  • Coefficient of variation

      The size of the standard deviation depends not only on the dispersion of the measured values, but also on the magnitude of the values – a higher mean value quite automatically leads to a higher standard deviation. To deal with this problem, the relative standard deviation, the coefficient of variation V, is often expressed as a percentage. Here, the standard deviation is divided by the arithmetic mean. As with the standard deviation, high values here also indicate a high dispersion of the measured values.

FAQ XRF

  • What is the XRF method (X-ray fluorescence)?

      Energy-dispersive X-ray fluorescence analysis (XRF) is a non-destructive measurement method that can be used to determine elemental compositions and layer thicknesses.  This method exploits the emission of characteristic X-rays from atoms that have been ionized by incident primary radiation. Using a suitable algorithm, conclusions can be drawn about the quantitative and qualitative element distributions in the sample being examined.

  • What can be measured using the XRF method?

      XRF measuring devices are used for non-destructive coating thickness determinationand material analysis. In principle, elements from Sodium (11) to Uranium (92) can be measured using XRF analysis. The coating thicknesses to be measured range from a few nm to approximately 100 µm. However, the layer thicknesses that can be measured in practice depend heavily on the layer system under consideration and, especially in the case of light elements, on the environmental conditions. This is where the physics of the measurement method sets limits. In elemental analysis, concentrations in the per mille range can be measured. Here, too, the element matrix and other influencing factors play an important role in practice. 

      What can be measured using the XRF method?
  • How large is the measurement spot for XRF measurements?

      The measuring spot on the sample is defined by the size of the collimator and the measuring distance used, or, in the case of polycapillary optics, by the spot size in focus. Typical values for collimators are 30 µm to 3 mm, and for devices with polycapillary optics between 10 and 20 μm.

  • What is an X-ray tube?

      The X-ray tube generates the primary X-ray radiation, which ionizes the atoms in the sample to be examined and thus provides the basic prerequisite for XRF analysis and the generation of characteristic fluorescence radiation in the sample. The primary X-ray radiation is a continuous spectrum that mainly consists of a bremsstrahlung background and characteristic X-ray radiation from the anode material used in the X-ray tube (in short: excitation spectrum). The exact shape of the excitation spectrum is further defined by the tube voltage and current used, as well as the spot size on the anode.

  • What is a shutter?

      The shutter is a safety-related component of our XRF devices and defines the exact measuring time by opening during the measurement. Otherwise, the shutter remains closed and blocks the primary X-ray radiation. Limit switches also ensure that the device cover is closed and that an operator cannot reach into the primary beam at any time during the measurement.

  • What is the purpose of a primary filter?

      The primary filter is used to modify the primary radiation. Depending on the filter, the excitation conditions for measuring tasks can be modified.

  • What is a collimator or aperture?

      The collimator limits the cross-section of the primary beam in our XRF measuring devices, ensuring that a measurement spot of a defined size is excited on the sample. If the sample geometry requires a relatively small measuring spot, our XRF devices offer a choice of different collimators. For extremely small measuring spot sizes due to the sample geometry, so-called polycapillary optics are used instead of mechanically manufactured collimators. This makes it possible to focus a comparatively large amount of the primary excitation radiation into a measuring spot in the order of 10 - 20 µm, depending on the polycapillary optics used. As a result, the measuring time is significantly reduced.

  • What are polycapillary optics?

      Polycapillary optics consist of thousands of thin glass capillaries that exploit the effect of total external reflection to focus X-rays into a spot measuring just a few µm. The polycapillary optics developed and manufactured in-house allow particularly small measuring spots of 10 or 20 μm (FISCHERSCOPE® X-RAY XDV®-μ) or 60 μm (long-distance polycapillary optics in the FISCHERSCOPE® X-RAY XDV®-μ LD). The microfocus effect of the polycapillary optics increases the X-ray beam up to 10,000 times compared to collimator optics. Our measuring devices with polycapillary lenses are therefore capable of measuring the smallest structures with short measurement times.

      * Spot size: Full width at half maximum (FWHM) for Mo-Kα

  • Which detectors are installed in FISCHER XRF devices?

      The detector absorbs the radiation (X-ray fluorescence) from the sample, as well as the scattered spectrum that reaches it, and measures it in an energy-dispersive manner. This means that during the measuring time, it assigns a specific energy to each incident photon and subsequently provides a fluorescence spectrum in the form of intensity versus energy. This spectrum forms the basis for the subsequent layer thickness and/or material analysis. One of the following three detector types is installed in our XRF devices. They differ in their mode of operation as well as in their primary area of application:

      • Proportional counter tube: Due to its comparatively large detection solid angle, this detector is ideally suited for simple measuring tasks, such as measuring the layer thickness of components with complex geometries that require a large measurement distance, or for comparatively thin layers with a small measurement spot.
      • Silicon PIN diode (PIN): Compared to the proportional counter, this mid-range detector has a much better energy resolution, which is why it is primarily used for measuring multilayer systems with sometimes very thin layer thicknesses or for material analysis.
      • Silicon drift detector (SDD): The strengths of this modern semiconductor detector lie in its superior energy resolution and its larger detection solid angle compared to the PIN diode. This makes it ideal for trace analysis or measuring light elements and very thin coatings down to the nm range.
  • What advantages does the digital pulse processor (DPP) offer?

      This high-tech component was developed by FISCHER. The digital pulse processor (DPP) converts analog signals into digital signals. The key to the quality of a DPP is its ability to process as many events as possible in the shortest possible time without any losses or the merging of multiple events into one.

      The DPP+ from FISCHER can process up to 500,000 pulses per second, thus contributing significantly to the optimization of measurement time while maintaining the shortest possible measurement times.

       What advantages does the digital pulse processor (DPP) offer?
  • How accurate are the results of XRF measurements?

      Accuracy refers to the estimated deviation between the measurement result and the “true” value of the sample.

      However, it is important to distinguish between random error, which affects precision, and systematic error, which affects accuracy. Precision is influenced by factors such as the quality of the spectrometer, the measurement distance, the measurement time, as well as operator influences and environmental conditions. Accuracy, on the other hand, is mainly affected by incorrect assumptions in calibration, such as uncertainties in the standards used or incorrectly assumed sample composition.

  • What factors influence the repeatability of XRF measurements?

      Repeatability is the dispersion of measured values obtained from a sample when measured with a device under identical conditions. A measurement under ideal conditions means that the sample remains unchanged between multiple measurements and is not moved. Influencing factors include, among others:

      • Quality of the spectrometer
      •  Measuring distance
      • Collimator / Measuring spot
      • Layer thickness
      • Excitation conditions
      • Measuring time
  • What factors influence the reproducibility of XRF measurements?

      Reproducibility is the dispersion of measured values obtained from a sample when measured with a device under varying conditions. Varying conditions means measurement under multiple positions and/or by different persons and/or under different environmental conditions. Influencing factors include, among others:

      • Positioning (inclined plane, cylindrical parts, shading)
      • Focusing of the sample
      • Operator influence
      • Properties of the sample
      • Thickness of the base material
      • More background (e.g., PCB due to scattered radiation)
      • Composition of base material and coating
      • Roughness
      • Environmental conditions
  • What factors influence the accuracy of XRF measurements?

      Accuracy is the estimated value of the deviation between the measuring result and the correct (unknown) value. Influencing factors include:

      • Traceability
      • Uncertainty of the standard
      • Uncertainty in the measurement of the standard
      • Errors in the base material correction
      • Density and composition of the layer
      • Difference between sample and calibration standard

FAQ XRF - Software and operation

  • Where can I download the latest software version for my XRF instrument?

      This is always supplied with our XRF devices. If you have any further questions, please contact your representative.

  • What does the “Data Export” mask mean?

      The export mask definition can be used to determine which parameters are to be exported.
      Go to “Evaluation ► Export ► Export Settings” in the WinFTM® software menu and define which data is to be exported and in what format.
      You can specify whether your files should be exported online, written to an Excel sheet, or forwarded via S232 output or TCP-IP. You can also (pre)define one or more export masks and choose from additional options.

  • What is measured when the XRF device asks for “Scatt”?

      In the WinFTM® software, “Scatt” refers to a scatter sample consisting of acrylonitrile butadiene styrene copolymer (or ABS for short). This sample and the corresponding scatter spectrum are calibrated at the factory.

      However, if you find yourself in a situation where the scatter spectrum needs to be measured again, you can load it into the software via the menu item “General à Load and evaluate”.

  • Why can't I create new measuring tasks?

      Creating new measurement tasks requires a specific software license, known as “super software”. If you have not purchased this license, you can either acquire it separately or have our experienced colleagues from the application department perform this task for you.

  • The XRF device prints all measured values without being prompted.

      The File “Print individual values” option has probably been activated in the WinFTM® software menu. In this case, each individual value is sent to the printer buffer and, when a page is full, it is automatically printed. Deactivate “Print individual values” and delete the printer buffer.

  • Measurement values have been deleted accidentally. Can I restore them?

      If individual values have been deleted within a block, a dash appears in the list of measured values. Go to “Evaluation ► Restore measured value” in the WinFTM® software menu to make individual measured values of a block visible again. However, if entire blocks or articles have been deleted, the data cannot be recovered.

  • What features of the software make measurement with FISCHER devices unique?

      Our WinFTM® software is the most powerful software on the market for coating thickness measurement and material analysis using X-ray fluorescence analysis. It efficiently evaluates and manages measurement data and enables standard-free, accurate measurement.

FAQ XRF - Application

  • For which industries is XRF suitable?

      XRF analysis is used in a wide variety of industrial sectors. No matter which industry you are at home in – we know your requirements and challenges, and so we'll find just the right tailor-made measuring solution for your application. Industries where we are trusted, among others:

      • Electronics and semiconductors
      • Electroplating
      • Automotive
      • Gold, precious metal analysis and jewelry
      • Paints and varnishes
      • Fastening technology
      • Iron and steel
      • Household and fittings
      • Aerospace
      • Construction and infrastructure
      • And much more

      Learn more about our industries.

       

  • What advantages does XRF offer over other measurement methods?

      • Non-destructive: the sample is not damaged by the X-ray fluorescence, making it ideal for incoming and outgoing inspections or during the manufacturing process.
      • Minimal sample preparation: in most cases, no sample preparation is required for measurement using X-ray fluorescence analysis.
      • Short measurement times: most applications can be measured within a few seconds.
      • Multi-element analysis: several elements and layer thicknesses can be determined simultaneously in a single measurement.
      • Wide range of applications: X-ray fluorescence analysis can measure element concentrations in the per mille range or purity levels of up to 100 %, as well as layer thicknesses ranging from a few nm to several 10 µm.
  • Why should I choose an XRF instrument from FISCHER?

      There are many reasons, see for yourself:

      • FISCHER = market leader in the field of coating thickness measurement
      • Extensive XRF product portfolio from handheld devices, benchtop systems to fully integrated high-end systems
      • Made in Germany, highest manufacturing quality
      • Unparalleled measuring precision and reliability
      • Many individual configurations suit your requirements: Different detectors, X-ray tubes and optics (collimators and polycapillary optics), Measuring direction, table configurations and more
      • Element analysis of up to 24 elements simultaneously
      • Certified and customized standards
      • Powerful software for coating thickness measurement and material analysis (WinFTM®, FISIQ® X)
      • First-class customer service and application consulting with decades of expertise

       

  • Where can I find relevant product information about my FISCHER XRF device?

      When you purchase your FISCHER measuring device, you will receive all further information conveniently via a QR code.

FAQ Tactile

FAQ Nanoindentation

  • My readings vary greatly. What can be the reason for this?

      The zero point cannot always be reliably determined for rough surfaces. Therefore, if possible, the surface should be polished. Air currents and external vibrations can also lead to high fluctuations in measured values or even to incorrect measurements. For this reason, the instruments should be set up in a protected location. When measuring with very low forces, closed measuring boxes and damping tables help to avoid external influences.

  • My measured values are wrong. What could be the reason for this?

      Possibly the indentor is dirty or worn. The WIN-HCU® provides a cleaning procedure that should be performed regularly. Also check whether you have selected the correct force-time regime for your application. Different test parameters can lead to deviations.

      If these measures do not help, a shape correction can also be performed if the indenter is worn. Shape correction should only be carried out by Fischer experts.

  • After measuring, no Indentor imprint can be seen on the surface. Why?

      Possibly the wrong objective is set on the microscope. Try a different objective and make sure that you have selected the correct objective in the WIN-HCU® software for instruments without automatic objective recognition.

      If the impression is still not visible, you may have selected too low an inspection force. In such cases, the impression can be seen with an atomic force microscope (AFM), for example. Another reason could be too large an offset between the microscope position and the actual measuring position. The set offset settings can be found under Measuring table ► Microscope settings.

      When measuring coatings in cross-section, it is recommended to use an appropriate micro-section sample holder from Fischer. If measurements are performed on transverse sections without a suitable holder, there will be a systematic offset from the measuring position to the microscope position for each measurement due to the mounting process.

  • Why do I not get any measured values for indentation hardness and indentation modulus?

      Probably the unloading curve was not recorded. Please check your settings. In addition, very soft samples can continue to deform under load (creep), which is why the indentation hardness cannot be determined in every case. Use the creep setting to determine the indentation creep (CIT). Use the Edit ► Application settings ► Parameters ► Straight, to determine indentation modulus EIT and indentation hardness HIT according to ISO 14577.

  • The loading and unloading curves are "deformed" and "strongly bent", respectively. What could be the reason for this?

      The sample has yielded under the load during measuring. Check whether the test specimen is well fixed. Depending on the component geometry, use our suitable accessories: the HM universal specimen grips or the HM foil clamping fixture from Fischer.

  • The loading curve has a kink. What could be the reason for this?

      The selected test load is too high for the coating thickness. The substrate material thus influences the measuring.

  • Why can't I activate the "Dynamic measurement mode"?

      You can only activate the dynamic measuring mode as an administrator. If activation is not possible despite administrator rights, this is usually due to customer-specific security-relevant software that prevents this. One possibility here is to use a computer with lower software-related security precautions.

  • Why is the menu item "Shape correction" grayed out and not selectable?

      The shape correction requires administrator rights. Please log in to WIN-HCU® accordingly. Shape correction should only be performed by Fischer experts or qualified personnel. The measuring was aborted and no new measuring can be started. In addition, the indentor position is at a value above 400 µm.

  • Why do I get an error message when I click 'Evaluation' ► 'Custom export'?

      You must first define the user-defined export under Setting ► Options ► User-defined export, before you can execute the export.

  • Where can I find the serial number and other important information about my measuring device?

      Select ? ► Info about WIN-HCU. Here you will find, for example, the serial number of the measuring device and the version of WIN-HCU®.

FAQ Measurement Methods

FAQ Calibration Tactile

  • Which statistical characteristic values should be used as a minimum when using measured values?

      For the comparison of measured values, at least the following characteristic values should be used: Arithmetic mean, standard deviation and number of individual measured values. Without the corresponding standard deviation and number of measured values, mean values cannot be meaningfully and seriously compared with each other.

  • Why do I have to calibrate my measuring device?

      According to the DIN EN ISO 9001 standard, measuring equipment must be calibrated if traceability is required. Every physical measuring method is influenced by the properties of the coating and base material. Examples of these properties are: part geometry, electrical conductivity, magnetism, density of the coating, or even the measuring surface. Therefore, every time the properties of the layer or base material change, it is most likely necessary to recalibrate the measuring equipment.

  • I calibrate my magnetic inductive or eddy current measuring device on a flat sheet and now want to measure on a turned part with a small diameter, for example. Is it possible to do this without another adjusted calibration?

      No. Calibration on the flat sheet creates a systematic measurement error on the curved surface. As a result, the measured values will be too high. This is because the measuring device evaluates the signals from the curved object as if they were coming from a flat part. Therefore, regular calibrations are necessary when the shape or geometry of the parts or measuring surface changes.

  • Two people arrive at different measurement results. What could be the reason for this and what can be done about it?

      Possible causes could be that two measuring devices with different calibrations (characteristic curves) are used or that measurements were made with the same measuring device but on different measuring surfaces. The correctness of measured values obtained with measuring devices is always ensured by calibration standards. In the case of magnetic induction and eddy current measuring devices, calibration must be performed on the measuring surface of the real, uncoated objects to be measured, on which the coating thickness must also be measured for the coated parts. Furthermore, it must be ensured that measurements are taken at the same point or on the same measuring surface and that a sufficient number of measured values are recorded for a meaningful mean value as well as a meaningful standard deviation. Only in this way can comparable measurement results be achieved.

  • How do you check a calibration for tactile coating thickness gauges?

      One measures a calibration foil on the uncoated workpiece with several measured values (usually 5 to 10) and this at the point where measurements will be taken later. Fischer base calibration plates are not useful for this calibration. Subsequently, the user must decide which deviations from the film setpoint and the measured mean value he will allow, so that the measuring device is still considered to be sufficiently well calibrated. The assessment of the calibration of a measuring device in the context of statistics and with regard to the uncertainty of the measured film thickness is provided, for example, by the standards DIN EN ISO 2178: 2016 "Non-magnetic coatings on magnetic base metals – Measurement of film thickness – Magnetic method" (Chapter 8) and DIN EN ISO 2360:2017 "Non-conductive coatings on non-magnetic metallic base materials – Measurement of film thickness – Eddy current method" (Chapter 8).

  • What must be taken into account when calibrating the FDX10 and FDX13H duplex probes?

      These duplex probes have two measuring channels. The magnetic inductive channel measures the total coating thickness of paint and zinc. The amplitude-sensitive eddy current channel measures the paint layer thickness on the zinc. For the calibration, a completely uncoated steel part corresponding to the original part and a galvanized part with at least 70 µm zinc are required. The magnetic inductive channel of the probes is calibrated on the uncoated steel part. The calibration foils used should frame the expected total coating thickness range (paint and zinc). The galvanized part is used to calibrate the amplitude sensitive eddy current channel. The calibration foils used should frame the expected paint layer thickness range.

  • What should be considered when calibrating the ESG2 and ESG20 duplex probes?

      These duplex probes have two measuring channels. The magnetic inductive channel measures the total coating thickness of paint and zinc. The phase-sensitive eddy current channel measures the zinc coating thickness under the paint. For the calibration, a completely uncoated steel part corresponding to the original part and a galvanized part with a typical zinc coating are required. The magnetic inductive channel of the probes is calibrated on the uncoated steel part. The calibration foils used should frame the expected total coating thickness range (paint and zinc). On the galvanized part, the phase sensitive eddy current channel of the probes is calibrated. No calibration foils should be used here, as the zinc layer itself is the calibration layer. It is only necessary to measure on the galvanized part during this step of the calibration. The zinc layer thickness does not need to be measured as a reference layer thickness before calibration. The calibration reference value of the zinc layer is provided by the magnetic inductive channel calibrated in the first step.

  • Does the density of the coating play a role in calibration?

      Yes, it does. For example, if the measuring device was calibrated with a part whose coating has a density of 2 g/cm³, and measurements are now to be taken on a part with a density of 1 g/cm³, for example, systematic measurement errors will occur. The measured values are then too low. This is the case because the measuring device evaluates the signals from the new object as if its layer also had the density 2 g/cm³.

FAQ Calibration XRF devices

FAQ Standards

  • What are calibration standards and why are they important?

      Calibration standards are materials with a known and verified composition that are used to adjust and check XRF devices. They ensure that measurement results are accurate and reproducible.

  • How do I select the right calibration standard for my measurement?

      The calibration standard should be as similar as possible to the material to be measured and the coating composition. This ensures that the calibration delivers realistic and accurate results.

  • What types of calibration standards does FISCHER offer?

      FISCHER offers a very extensive range of over 500 certified standards. These include

      • Solid standards for single and multiple layers, alloy layers, pure elements, and alloys

      • Film standards for single and multiple layers and alloy layers, or prefabricated sets for specific industries and applications.

  • What are the main advantages of FISCHER calibration standards?

      • Globally recognized traceability

      • Over 500 certified standards

      • Highest accuracy thanks to DAkkS certification, Link: www.helmut-fischer.com/why-fischer/dakks-calibration-laboratory

      • Own accredited calibration laboratories worldwide

      • Individual customer standards possible

      • Comprehensive expert advice

  • Can I still use my standard if it is creased, torn, or damaged?

      No, if your standard is creased, torn, or otherwise damaged, it should not be used. Please handle your calibration foils with great care, as their thin layers make them particularly susceptible to tearing or deformation. If you notice any damage, we recommend sending the standard to us for inspection. Please get in touch with us directly.

      Cu foil torned  Au Foil Crinkled  Nb Foil torned    Au Foil OK
      Cu foil, torned
      not ok
        Au foil, crinkled
      not ok
        Nb foil, torned
      not ok
          Au foil
      ok

       

  • Which part of the standard is certified for measurement?

      For X-ray standards, a central area of 2 x 2 mm is specified in the certificate. If a different measurement area is certified, it will be explicitly stated in the certificate. For tactile foils, the certified measurement area is marked with a circle directly on the foil.

      Au Foil OK
      The certified measurement area is marked red.

       

  • How often should I send in my standard for maintenance or inspection?

      We at Fischer do not specify a particular maintenance interval. The need to send in your standards for recalibration can be significantly influenced by usage conditions, environmental and storage factors, as well as your company’s reliance on specific standards and/or internal inspection equipment requirements. Therefore, you or your inspection equipment monitoring team are best positioned to assess and determine the appropriate interval for sending in your standards. A typical value would be approximately every 1–3 years.

      Do you need individual consultation? Don’t hesitate to get in touch with us.

  • Does the certificate have an expiration date?

      No, the certificate does not have a fixed expiration date. The need to send in your standards for recalibration can be significantly influenced by usage conditions, environmental and storage factors, as well as your company’s reliance on specific standards and/or internal inspection equipment requirements. Therefore, you or your inspection equipment monitoring team are best positioned to assess and determine when recalibration is necessary.

      Do you need individual consultation? Don’t hesitate to get in touch with us.

  • I have requirements that are not covered by the Fischer calibration standard catalog. Do you also offer customized solutions?

      Yes, we offer customized special solutions. On the one hand, we can combine layer thicknesses from our catalog to match your specific requirements, provided this is technically feasible. On the other hand, if technically possible, we can create a standard from your own material. Please feel free to discuss your needs with your personal Fischer representative.

  • The surface of my standard is discolored. Can/Should I clean my standard?

      Standards should never be cleaned mechanically or chemically! Doing so can cause damage, inhomogeneities, and/or a reduction in layer thickness, which may alter your calibration results.

      Discoloration of Al, Cu, Ag: For these metals, oxidation of the metal surface forms an oxide layer that shields the underlying metal from further reaction with oxygen (passivation). Depending on the metal, this can cause typical discoloration, which, however, does not negatively affect the measurement results.

      Important: Do not clean your standards! Removing the oxide layer by abrasion can lead to distorted calibration results.

      Discoloration of Fe, Zn, Zn/Fe: In the case of iron oxidation (rust) or zinc oxidation (white rust), corrosion has a destructive effect on the standard. If corrosion occurs, these standards must be sent in for replacement. Since a corrosive environment accelerates the corrosion process, please always pay particular attention to the correct handling and storage of your standards (see also the following question).

      Exceptional case COULOSCOPE® standards: Our COULOSCOPE® standards are an exception when it comes to cleaning. They come with an “eraser” that allows you to reactivate the nickel oxide layer.

  • How should I store my standards?

      Do not store your standards in condensing or corrosive atmospheres. Excessive humidity can damage the layers.

  • Can I remove the DAkkS labels from my standard case?

      No, please do not remove the DAkkS marks from the cases. The DAkkS certificate remains valid only in conjunction with the corresponding DAkkS marks on the cases.

  • I can't find my DAkkS certificate. Where or how can I get a new one?

      Upon request, we can reissue DAkkS certificates. However, please note that this involves a long lead time and additional costs. For this, please contact your personal Fischer representative directly who will be happy to provide you with an individual offer.

  • Is the DAkkS certificate also available in digital form?

      Not yet, unfortunately, but we are working on it.

  • Where can I find the terms and conditions?

  • Is it possible to measure Fischer standards with my FISCHERSCOPE® X-RAY XDV®-µ device?

      Yes, but this depends on the polycapillary optics installed in your device. Depending on the polycapillary optics, you can measure measuring spots in the range of approx. 10-50 µm. With these very small measuring spots, you can visualize localized inhomogeneities, such as “pin holes”, or thickness differences on surfaces with high roughness. Single-point measurements of our calibration standards can therefore (depending on the material) lead to larger measurement scatter or falsification of the calibration results. For standards measured with our FISCHERSCOPE® X-RAY XDV®-µ devices, you should therefore always use scan mode.

  • Where can I find the declaration of conformity?

      Since standards are individual and not subject to normalization, we cannot issue a declaration of conformity. In addition, we also provide standards for RoHS measurements and special coatings, some of which require the use of materials that are not RoHS compliant.

  • The nominal value on the delivered standard differs from the value stated in the offer. What is the reason for this?

      Our standards are subject to manufacturing-related variations of ±20 % of the specified coating thickness. This does not constitute a defect but is within the permissible tolerance range. We always provide you with standards that are as close as possible to the specified quotation value.

  • Which value applies: the value on the standard or the value on the certificate? Why are these values different sometimes?

      All measurement values are subject to a certain degree of variation. Therefore, the values stated in the certificate after recertification may differ from the labeled value, as long as they remain within the specified measurement uncertainty. For tactile foils certified according to DIN EN ISO/IEC 17025:2017, the values printed on the foil may also differ from those listed in the certificate due to system-related factors. The current valid value is always the one stated in the certificate.

  • Are tactile standards also at risk of wear and tear?

      Yes, tactile standards are generally subject to natural wear and tear due to tactile measurement. As soon as damage such as dents or cracks become visible within the marked measuring surface, we recommend replacing the standard.

  • Why are tactile foils not recertified?

      Foils for tactile measuring devices are subject to wear and tear due to use and therefore cannot be recertified.

  • The measured values from third-party certification of plastic foils for tactile measuring devices are higher than the values Helmut Fischer provides. What is the reason for this?

      The deviation in foil thickness is probably due to the measurement setup. We assume that the foils were measured with a flat stamp. With this method, virtually no impression is made in the foil when measuring the foil thickness. Thus, the actual thickness of the foil is measured. The foil thickness measured using this method is usually slightly higher than the foil thickness specified by Fischer.

      The calibration foils measured by us are used to calibrate our devices with the corresponding measuring probes.

      The measuring probes of Fischer have a small ball tip that is placed on the calibration foil or on the surface to be measured. When the probe is placed on the plastic foil, this ball tip creates a small pressure mark, which depends, among other things, on the thickness of the calibration foil. This indentation is taken into account when measuring our calibration foils. Consequently, the nominal value of the calibration foils manufactured by Helmut Fischer will always be slightly lower than the actual thickness of the calibration foil. If this pressure mark on the calibration foils were not taken into account, you would actually measure incorrect layer thicknesses on the real parts after calibrating our measuring devices with these foils.