FISCHERSCOPE® XDV®
New
with optimized measurement geometry
sample positioning
user guidance with FISIQ® X software
Speed meets precision.
Built for maximum speed, highest precision, and intuitive ease of use – that's how we introduce the new generation of XRF instruments with our FISCHERSCOPE® XDV®. As one of our high-end XRF solutions, the instrument is designed for measuring on microstructures with confidence. Combined with our cutting-edge FISIQ® X software, the device delivers outstanding measuring performance. In addition, simplified and efficient workflows ensure smooth measurement processes and significantly increased throughput in your quality control.
Super-fast sample positioning.
High-speed Z-axis 6 x faster*
Rapid sample capture.
Autofocus in under 2 seconds – 14 x faster*
Automated operation.
Automated or manual hood for maximum flexibility
Optimum sample illumination and picture capture.
10 x higher* camera resolution and multizone LED lighting
* In comparison to FISCHERSCOPE® X-RAY XDV®-SDD.
Unparalleled high precision and repeatable results.
Optimized measurement geometry
Device status always visible.
Intuitive 180° status light
Enhanced usability and user guidance.
New FISIQ® X software
Always keep everything in view with the high-resolution overview camera. Whether matte, glossy, or reflective surfaces – the multi-zone LED lighting reveals every detail with precision.
Choose between automated and manual operation, enhanced by a motorized hood for maximum flexibility in your measurement workflows.
See the device status immediately with intuitive status lighting: standby (blue), ready for measuring (green), or active measuring (pulsating orange).
Benefit from outstanding measurement accuracy and get reliable, high-quality results thanks to the optimized distance between X-ray tube, sample, and detector.
Achieve fast, ultra-precise measurements with simplified and efficient workflows, even in the most challenging applications like wafer analysis.
Meet FISIQ® X now – the first XRF software with AI technology!
Features
Microfocus tube with tungsten anode, other anodes available on request
Silicon drift detector 50 mm² for highest precision on thin layers
Automated hood and programmable measuring table for automated measurements
4-fold changeable apertures and 6-fold changeable filters
Individual approval as fully protected instrument
FISIQ® X software with AI-supported spectrum mode for smarter measurement processes
Stepless measuring distance with measuring top down
Up to 140 mm possible heights of samples
Application examples
- Analysis of very thin coatings, e.g., gold/palladium coatings of ≤ 50 nm (0.002 mils)
- Measurements of functional coatings in the electronics and semiconductor industries, e.g. determination of the coating thickness of gold layers down to 2 nm (0.00008 mils) for lead frames
- Measurement of ultra-thin coatings on silicon wafers
- Determination of light element coatings on wafers (Al, Ti, NiP)
- Fuel cell and battery foils: metals (Pt, Ir, Ce; Ni, Co, Mn) in organic matrix (carbon)
- Gold analysis with highest requirements
- Measurement of complex multilayer systems
- Automated measurements, e.g. in quality control
Do you have further applications? Then contact us!
Tutorial Notes
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Tutorial Notes
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