FISCHERSCOPE® XDAL®
New
faster positioning
faster autofocus
higher camera resolution
¹ In comparison to FISCHERSCOPE® X-RAY XDAL® 237.
² Depending on the sample surface.
Easy handling, maximum speed and precision.
The FISCHERSCOPE® XDAL® is ideal for applications in the field of thin and very thin coatings < 0.05 μm and for material analysis in the ppm range. The device version is equipped with the latest generation of powerful detectors, a 50 mm² silicon drift detector. The intuitive status lighting and the automated measuring hood, together with the modern FISIQ® X XRF software, ensure a smooth measuring process – for greater convenience, safety and maximum throughput.
High-speed Z-axis.
For fast positioning of your samples
Autofocus under 2 seconds.
Fast acquisition and focusing of your measurement object for even more efficient measurement processes
High-resolution overview camera.
Keep a better overview with sharper and more detailed images
Multi-zone LED lighting.
Perfect illumination at all times, no matter the surface
Automated measurement hood.
Manual or automated operation for maximum flexibility
Optimized measurement geometry.
Unparalleled measurement accuracy thanks to enhanced spacing between X-ray tube, sample, and detector
Intuitive status lighting.
Check the device's status at a glance
Detail camera with multi-zone LED lighting: optimum illumination for all sample surfaces (matt, glossy, reflective).
Motorized hood that can be opened and closed at the press of a button or software-controlled. For smooth and efficient processes.
An improved distance between the X-ray tube, sample and detector ensures maximum intensity and guarantees unparalleled measurement accuracy - for maximum reliable and high-quality results.
The LED light strip shows the status of the device at a glance. Blue light indicates standby mode, green indicates a device ready for measurement and pulsating orange indicates an ongoing measurement.
FISIQ® X: The modern and first XRF software with AI-supported spectrum mode. Increase your productivity with simplified and efficient workflows.
Features
Microfocus tube with tungsten anode, other anodes available on request
C-slot housing for automated measurements on larger samples
Silicon drift detector 20 mm² or 50 mm² for highest precision on thin layers
4-fold changeable apertures and 6-fold changeable filters
Type approved full protection device
Software FISIQ® X with AI-supported spectrum mode for smarter measurement processes
Stepless measuring distance with measuring top down
Up to 140 mm possible heights of samples
Programmable measuring table for automated measurements
Application examples
- Analysis of very thin coatings of ≤ 0.1 μm (0.004 mils)
- Measurements of functional coatings in the electronics and semiconductor industries, e.g. on lead frames, connectors or printed circuit boards
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
- Determination of the lead content in solder
- Determination of the phosphorous content in NiP coatings
- Determination of PCB finishes
Do you have further applications? Then contact us!
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Product videos
FISCHERSCOPE® XDAL® & XDV®Brochures
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