FISCHERSCOPE® XDAL®
New
with optimized measurement geometry
sample positioning
user guidance with FISIQ® X software
Easy handling, maximum speed and precision.
When precision pushes boundaries, our FISCHERSCOPE® XDAL® redefines what’s possible. The innovative successor to our FISCHERSCOPE® X-RAY XDAL® is ideal for applications in the field of thin and very thin coatings < 0.05 μm and for material analysis in the ppm range. You can choose between our models XDAL® 650, equipped with our powerful silicon drift detector 50 mm², and XDAL® 620, equipped with a silicon drift detector 20 mm². Together with our cutting-edge FISIQ® X XRF software, this high-end solution ensures a smooth measuring process for greater convenience, safety, and maximum throughput.
Super-fast sample positioning.
High-speed Z-axis 6 x faster*
Rapid sample capture.
Autofocus in under 2 seconds – 14 x faster*
Automated operation.
Automated or manual hood for maximum flexibility
Optimum sample illumination and picture capture.
10 x higher* camera resolution and multizone LED lighting
* In comparison to FISCHERSCOPE® X-RAY XDAL® 237.
Unparalleled high precision and repeatable results.
Optimized measurement geometry
Device status always visible.
Intuitive 180° status light
Enhanced usability and user guidance.
New FISIQ® X software
Large parts.
C-slot allows large part measurement
Optimum sample illumination and picture capture thanks to high-resolution overview camera and multi-zone LED lighting.
Measure your way – automated or manual – supported by a motorized hood for maximum flexibility.
Stay in control at all times! The device status lighting indicates standby (blue), ready for measuring (green), or active measuring (pulsating orange).
An improved distance between X-ray tube, sample, and detector ensures maximum intensity and guarantees unparalleled measurement accuracy – for maximum reliable and high-quality results.
Boost your productivity with simplified and efficient workflows. Meet FISIQ® X now – the first XRF software with AI technology!
Features
Microfocus tube with tungsten anode, other anodes available on request
C-slot housing for measuring larger samples
Silicon drift detector 20 mm² or 50 mm² for highest precision on thin layers
4-fold changeable apertures and 6-fold changeable filters
Individual approval as fully protected instrument
FISIQ® X software with AI-supported spectrum mode for smarter measurement processes
Stepless measuring distance with measuring top down
Up to 140 mm possible heights of samples
Automated hood and programmable measuring table for automated measurements
Application examples
- Analysis of very thin coatings of ≤ 0.1 μm (0.004 mils)
- Measurements of functional coatings in the electronics and semiconductor industries, e.g. on lead frames, connectors, or printed circuit boards
- Measurement of complex multilayer systems
- Automated measurements, e.g., in quality control
- Determination of the lead content in solder
- Determination of the phosphorous content in NiP coatings
- Determination of PCB finishes
Do you have further applications? Then contact us!
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