The high-end allrounder.

Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.


Up to 50% ¹ increased
performance thanks to DPP+
changeable apertures
changeable filters
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¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.

X-ray fluorescence analysis for universally highest demands.

The FISCHERSCOPE® X-RAY XDV®-SDD is one of the most powerful X-ray fluorescence instruments in the Fischer portfolio. Take your measurement performance to a new level with this premium model: In combination with the in-house developed digital pulse processor DPP+, even higher count rates can now be processed, resulting in reduced measuring times or improved repeatability of your measurement results.

Built to last.

Robust design for particularly high requirements

Fully automatable.

Let your device work for you with just one click

Quick-measure design.

With a few simple steps, the sample is placed and ready for measurement. Automated measurements of many parts are possible


Thanks to short measuring times, you save valuable time

RoHS analysis.

Determination of pollutants with high detection accuracy and outstanding performance

DPP+ digital pulse processor.

Shorter measuring times or improvement of standard deviation*

*compared to the DPP

  • Features

      Microfocus tube with tungsten anode

      Silicon drift detector 50 mm² with extra-large effective area of 50 mm²

      Determination of metal content in electroplating baths with corresponding accessories

      Measuring spot approx.: Ø 0.25 mm

      Higher count rates and significantly reduced measurement times thanks to DPP+

      Type approved full protection device

      Up to 140 mm possible height of samples

      4-fold changeable apertures and 6-fold changeable filters

  • Application examples

      • Measuring functional coatings in the electronics and semiconductor industry, e.g. determining the thickness of gold coatings down to 2 nm
      • Analysis of thin and very thin coatings in the electronics and semiconductor industry, such as gold/palladium layers of ≤ 0.1 μm
      • Determination of complex multilayer systems
      • Coating thickness measurement for photovoltaics, fuel cell and battery cell applications
      • Trace analyses of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer products
      • Analysis and authenticity check of gold and other precious metals and precious metal alloys
      • Direct determination of phosphorus content in functional NiP layers
      • Determination of the metal content of electroplating baths

      Do you have further applications? Then contact us!

Application Notes
Product videos
Technical articles
FISCHERSCOPE® X-RAY XDV® series: Up to 50% improved performance
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
FISCHERSCOPE® X-RAY tutorial: Stability test
FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
Setting up measurement equipment monitoring
ZnNi-Fe coating: Measurement of coating, as well as control of the associated baths
Report documentation

Fischer Insights.

Measuring method.

Learn and discover how the X-ray fluorescence analysis works.

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We offer you everything you need for reliable measurement results.

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Why Fischer.

Experience many good reasons that speak for us as a company.

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