FISCHERSCOPE X-RAY XDL and XDLM
- Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568
- Smallest measuring spot XDLM: approx. 0.1 mm; smallest measuring spot XDL: approx. 0.2 mm
- Tungsten X-ray tube or tungsten microfocus tube (XDLM) as an x-ray source
- Proven proportional counter tube detectors for fast measurement
- Fixed or changeable collimators
- Fixed or automatically exchangeable primary filters
- Available with either a manual or a programmable XY stage
- Slotted housing for measuring on large printed circuit boards
- Video camera for easy fixing of the measurement location
- Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
- Certified full-protection devices
- Electroplated, galvanized coatings such as zinc on iron as corrosion protection
- Serial testing of mass-produced parts
- Analysis of the composition of special steels, e.g. detection of molybdenum in A4
- Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS
- All typical chrome coatings – also new ones such as CrVI
- Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB
- Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu
The FISCHERSCOPE® X-RAY XDL® and XDLM® X-ray fluorescence (XRF) spectrometers are closely related to the XUL series. All the main components – such as the detector, X-ray tubes and filter combinations – are identical. But there is a significant difference: The XDL and XDLM devices measure from top to bottom. And that means convenient XRF analysis of non-flat samples – complex shapes are no longer a problem!
The top-down approach has another advantage: it makes for easy automated XRF measurements. Equipped with a programmable sample stage, the XDL 240 and XDLM 237 are ideal for scanning surfaces. So you can check the thickness of layers on larger parts or automatically measure lots of small parts one after another.
As with the XUL series, the ‘M’ in XDLM stands for ‘microfocus tube’. This means that these XRF devices are particularly well suited for analyzing small samples. With a measuring spot just 0.1 mm in diameter, the XDLM is perfect for the electronics industry.