FISCHERSCOPE X-RAY PCB series

The professional XRF series for testing printed circuit boards

Today’s printed circuit boards have a vast number of coated contact points. In order to guarantee the reliability of soldered joints, corrosion resistance and shelf life, the respective thicknesses of the various materials must be in correct relation. For monitoring these tight specifications, energy-dispersive X-ray fluorescence is the method of choice.

With the PCB series, Helmut Fischer offers specialized measurement solutions for printed circuit boards. The PCB professionals provide reliable and fast results for simple as well as for ambitious measurement tasks and layer thickness measurement down to the nanometer range.

Various models are available depending on your requirements. Call us! We’re here for you.

FISCHERSCOPE X-RAY XULM-PCB

For simple measurements and spot checks, the FISCHERSCOPE® X-RAY XULM®-PCB is the ideal XRF instrument. As a robust entry-level instrument, the XRF spectrometer is equipped with a proportional counter tube detector, which makes for short measuring times.

Tungsten microfocus tube for standard applications
Smallest measuring spot Ø approx. 0.15 mm
Proportional counter tube detector for analyzing elements from potassium (19) to uranium (92)
Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
Fixed, wide sample stage for printed circuit boards up to 610 x 610 mm (24” x 24”)
Maximum sample height 90 mm
Fully protected instrument with type approval according to German radiation protection law

FISCHERSCOPE X-RAY XDLM-PCB

The FISCHERSCOPE® X-RAY XDLM®-PCB is also equipped with a proportional counter tube. However, this XRF instrument has a variety of collimators and filters so you can create the optimal measuring conditions for your task. In the basic configuration, it has a pull-out sample stage, which simplifies positioning of the PCB. On request, a programmable XY stage is also available for automated measurements.

Tungsten microfocus tube for standard applications
Optional 4x changeable aperture for optimized measuring conditions
Optional 3x changeable filter for better excitation conditions for more complex tasks
Smallest measuring spot Ø approx. 0.15 mm
Proportional counter tube detector for analyzing elements from potassium (19) to uranium (92)
Manually extractable or a programmable measuring stage for printed circuit boards up to 610 x 610 mm (24” x 24”)
Maximum sample height: 5 mm
Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
Individual acceptance inspection as a fully protected instrument according to German radiation protection law

FISCHERSCOPE X-RAY XDAL-PCB

In contrast to the XULM-PCB and XDLM-PCB, the FISCHERSCOPE® X-RAY XDAL®-PCB is equipped with a highly sensitive silicon drift detector (SDD), different apertures and filters. This creates optimum measurement conditions also for testing ENIG and ENEPIG coatings. In its basic configuration, the instrument has a pop-out sample table that simplifies PCB positioning. On request, this can be equipped with a sample table extension for large PCBs.

Tungsten or chrome microfocus tube
4x changeable aperture for optimized measuring conditions
3x changeable filter for optimum excitation conditions for more complex tasks
Smallest measuring spot Ø approx. 0.15 mm
Silicon drift detector (SDD) for analysis of elements from aluminum (13) to uranium (92)
Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
Manually extractable stage for printed circuit boards up to 610 x 610 mm (24” x 24”)
Maximum sample height 10 mm
Individual acceptance inspection as a fully protected instrument according to German radiation protection law

FISCHERSCOPE X-RAY XDV-µ PCB

In high-reliability applications, printed circuit boards are quality-critical components. In such cases, high-end coatings according to the ENIG and ENEPIG processes are employed. Since the thinnest layer thicknesses in these processes are between 40 and 100 nm, the accuracy of proportional counter tubes no longer suffices to monitor the process. This is where the FISCHERSCOPE® X-RAY XDV®-µ PCB is the right choice. The combination of a highly sensitive silicon drift detector (SDD) and polycapillary optics allows for precise measurements on structures less than 50 µm in size.

Especially when dealing with very small structures, individually selecting each measuring position can take a lot of time if large numbers of random samples are to be inspected. But with the image recognition software implemented by Fischer, you can save yourself this effort. Simply store a section of the image. The XDV-µ PCB searches for corresponding structures and measures them automatically.

Microfocus tube with tungsten or molybdenum
4x changeable aperture for optimized measuring conditions
4x changeable filter for optimum excitation conditions for more complex tasks
Polycapillary optics for very small measuring spots Ø approx. 20 or 10 µm
Silicon drift detector (SDD) for analysis of elements from aluminum (13) to uranium (92)
Programmable measuring stage, optionally with vacuum holder for FLEX PCBs
Maximum sample height < 4-5 mm
Individual acceptance inspection as a fully protected instrument according to German radiation protection law