Energy dispersive X-ray fluorescence analysis has become indispensable as a tool for analyzing connectors during the development process and for testing during production. In addition to the simple determination of layer thickness and material composition, X-ray fluorescence microscopy is becoming increasingly important. The latter allows local variations to be quantified even within the contact point and statements to be made about homogeneity. Mechanical properties such as hardness and elasticity of the contact surface are also increasingly sought-after parameters. By means of nanoindentation, the determination of such parameters is possible even for very thin layers as well as depth-dependent.
Read more in the paper on "Analysis of Plug Contacts - Interaction of Measurement Methods" by Dr. Konstantinos Panos and Wladislaw Feuchtenberger. (available in German only).
Presented at "Anwenderkongress Steckverbinder 2022".