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The revolutionary DMP® device series for tactile and non-destructive coating thickness measurement.

With very low surface roughness using the inverted fireball process.

Get to know high-precision measuring and analysis equipment from the world market leader and try it out for yourself.

Measurement technology from Helmut Fischer, their composition can be precisely analysed at any time.

From now on, the FISCHERSCOPE® X-RAY XDV® units not only shine in a new design, but also convince with a significant performance boost.

Experience measurement precision - discover and try out high-precision measuring and analysis equipment from the measurement technology specialist.

Optimum quality assurance for the entire range of surface technology with measuring instruments from the world market leader in measurement technology.

New member of the Fischer PCB family for precise measurement and analysis of layer thicknesses and layer compositions on printed circuit boards.

Read our new Application Note to learn how you can benefit from using X-ray flourescence analysis (XRF) for this particular application!