Lead frame

Gli strati di rivestimento multipli applicati ai lead frame – per esempio rivestimenti in oro, palladio, nichel e rame – hanno ciascuno uno spessore di appena pochi nanometri. FISCHER offre una tecnologia di misurazione studiata in modo specifico per l'industria elettronica per determinare lo spessore e la composizione di sistemi di rivestimento multistrato complessi sui lead frame. Il metodo è preciso, ripetibile e non distruttivo.

Lead frame

Note Applicazione

High Repeatability Precision and Trueness of Au / Pd Coating Measurements on Leadframes

As the electronics industry makes use of ever thinner coatings, manufacturers increase their demands on measuring technologies to provide reliable parameters for product monitoring and control. The coating system Au/Pd/Ni is frequently used in the electroplating of leadframes, with CuFe2 (CDA 195) as substrate material. Typical coating thicknesses are between 3-10 nm Au and 10-100 nm Pd. For monitoring the quality of these coating systems, X-ray fluorescence instruments have established themselves as the measurement method of choice.

A series of comparative tests employing other physical measurement methods was used to determine the capabilities of X-ray fluorescence instruments within the mentioned ranges. Sample specimens were measured with the X-ray fluorescence method using the FISCHERSCOPE X-RAY XDV-SDD model, Rutherford backscatter and absolute, synchrotron radiation based X-ray.

High resolution measurement of an Au/Pd/Ni coating system

Fig. 1: High resolution measurement of an Au/Pd/Ni coating system on a leadframe and presentation of the results with the analysis software, WinFTM®.

For Au coating thicknesses of about 4, 6 and 9 nm, the results from the X-ray fluorescence instruments were all between the two other methods, with deviations in the sub-nm range, confirming not only the low scatter but also the trueness of measurements using X-ray fluorescence instruments. Traceability of the measurement results is ensured by using the FISCHER calibration standards developed specifically for this measuring application. The simple handling of X-ray fluorescence instruments also allows for easy scanning of a specimen to determine the homogeneity of the coating thickness, if required (see Fig. 2).

Lateral coating thickness distribution of a specimen coated with only a few nm Au.

Fig. 2: Lateral coating thickness distribution of a specimen coated with only a few nm Au.

The combination of state-of-the-art detector technology and the powerful analysis software, WinFTM®, allows for reliable, accurate measurements of coating thicknesses even in ranges below 10 nm. For use on leadframes, the FISCHERSCOPE® X-RAY XDV®-SDD instruments are recommended for relatively normal-sized specimens; for very small structures, the XDV®-µ model, with its special X-ray optics, ensures a very small measurement spot of only 20 µm on the specimen.

Contatto con FISCHER

Contact

Helmut Fischer s.r.l. Tecnica di Misura
Sesto San Giovanni (MI)/Italia

Contatta direttamente
Tel.: (+39) 02 255 26 26
E-mail: italy@helmutfischer.com
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