Of course, the budget plays a key role when choosing an X-ray fluorescence analyzer (XRF instrument). However, the most expensive measuring device is not automatically the most suitable for every measuring task. It is much more important to determine the ideal measuring device with the optimum features against the background of the given requirements and objectives. In terms of appropriate use, the following applies: The value of the measuring instrument depends on the complexity of the requirements. In order to find a suitable XRF device for a specific measurement task, influencing factors like sample type, sample size, sample geometry, coating thickness range, required measurement spot size, measuring mode (coating thickness measurement and/or material analysis), complexity of the measurement task, number of coatings, tolerances of the process to be monitored and much more must be taken into account.

In this Application Note you will learn, among other things:

• the most important differences between our detectors
• the importance of choosing the right X-ray optics
• more about the influence of air on measurements and how this can be reduced with helium