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FISCHERSCOPE X-RAY XULM
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The Right Measurement Technology for Chrome(III)FISCHERSCOPE X-RAY XDAL
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Helmut Fischer - First-class measuring instruments for coating thickness measurement, material analysis and material testing

Helmut Fischer GmbH is a full-service supplier in the field of surface testing and has been developing high precision instruments for surface measurements since 1953. As a leading manufacturer of measuring instruments, our portfolio extends from simple handheld devices for quick measurements on the go to fully integrated high-end systems that automatically monitor production. For every application we provide the right solution.

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Frรฉdรฉric Saulcy, CEO of Saulcy Traitement de Surface, CH
Paul Comer, Technical Director at Graphic Plc, UK
Hampton Watkins, Quality and Logistics Manager at Greenwood Fabricating & Plating (GF&P), USA
Karsten Seidel, Employee Audi AG, DE

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Helmut Fischer presents the new FISCHERSCOPE X-RAY XDAL-PCB

The new member of the Fischer PCB family for precise measurement and analysis of layer thicknesses and compositions on printed circuit boards

With the introduction of the FISCHERSCOPEยฎ X-RAY XDALยฎ-PCB, Helmut Fischer supplements its PCB series. Higher count rates are made possible due to the combination of multicollimators and a highly sensitive silicon drift detector (SDD). This results in excellent energy resolution, short measuring times and optimal repeatability. The benchtop device is simple to operate and is designed for the measurement of functional layers as well as the smallest components and structures on printed circuit boards.

As a full-range supplier in the field of surface inspection, Helmut Fischer is continuously working to adapt its portfolio to the specific needs of its customers. With the PCB series, the measurement technology specialist offers users specialized measurement solutions for PCBs. The devices deliver reliable and fast results for both simple as well as complex measurement tasks and layer thickness measurement down to the nanometer range. The new XDAL-PCB is a great addition to the PCB series, as it closes the gap between the more cost-effective entry level devices, XULM-PCB and XDLM-PCB, and the premium device, XDV-ยต PCB.

The measuring instrument has four changeable apertures (collimator) and three changeable primary filters. This creates ideal excitation conditions for every measurement and results in flexibility for a wide range of measurement tasks. Equipped with a powerful silicon drift detector (SDD), the XDAL-PCB easily measures more complex applications and very thin layers. The manually extractable measuring stage enables quick and easy sample positioning. Additionally, this can be configured with a measuring stage extension or an automated XY stage.

The XDAL-PCB is ideally suited for quality assurance in manufacturing and applications such as the determination of the lead content in solder or the phosphorus content on NiP layers, the analysis of the composition of electroplating baths or the typical layer structure on PCBs. Furthermore, the instrument fulfils the requirements to measure ENIG and ENEPIG coatings.

When developing the FISCHERSCOPEยฎ X-RAY XDALยฎ-PCB, special attention was paid to robustness and reliability. Thus, all prerequisites for a long service life under the most adverse conditions in the electronics and semiconductor industry have been created. Like the rest of the product range of the measurement technology specialist, Helmut Fischer, this device also features high accuracy and long-term stability. These features reduce the calibration effort and save time and costs.

More information on helmut-fischer.com

Case studies

Measuring and analysis devices from Fischer are used in a wide variety of industries around the world - wherever precision, reliability and simple operation are required. 

GOLDSCOPE SD
Product highlightsGOLDSCOPE SDGOLDSCOPE SD
XRF For Inline Measurement | Automated XRF System | X-RAY 4000
Product highlightsXRF For Inline Measurement | Automated XRF System | X-RAY 4000XRF For Inline Measurement | Automated XRF System | X-RAY 4000
FMP100 and H FMP 150, Coating Thickness Gauge
Product highlightsFMP100 and H FMP 150, Coating Thickness GaugeFMP100 and H FMP 150, Coating Thickness Gauge
FISCHERSCOPE HM2000
Product highlightsFISCHERSCOPE HM2000FISCHERSCOPE HM2000

Individual advice and excellent all-round service on site

Everything from one source for perfect quality management: that is the claim of Helmut Fischer! Receive the complete package of services for your optimal measurement result. Because precise, reliable measurements require more than just a first-class measuring device. Starting with a detailed requirements analysis to select the right measuring instrument. Through professional commissioning and product training for the best possible device use. Up to comprehensive and fast service for long-term instrument use. Only available from Helmut Fischer: with ISO / IEC 17025-certified Fischer calibration standards, you can measure precisely and reversibly. Have your sample certified as a calibration standard too!

Expert for coating thickness measurement, XRF analysis, nanoindentation, scratch testing & more

"Measuring Made Easy". According to this motto, Helmut Fischer has been developing and manufacturing measuring instruments for coating thickness measurement, material analysis, materials testing and microhardness for industry and laboratories since 1953. The inventive spirit of the founder, Helmut Fischer, is an integral part of Fischer's corporate culture to this day. It all started with a handheld device for measuring coating thickness. In 1981 the first XRF X-ray fluorescence measuring instrument for precise, non-destructive coating thickness measurement and XRF material analysis was launched. Further measuring and test instruments from the field of nanoindentation and scratch testing, as well as automated measuring solutions, followed.

Broad product portfolio wit handheld devices, XRF spectrometers, benchtop instruments, automation & more

The Fischer product portfolio includes measurement technology from the areas of coating thickness measurement, XRF analysis, nanoindentation, scratch testing, conductivity measurement, ferrite content determination and others. Starting with handheld devices for quick coating thickness measurement in corrosion protection, through XRF spectrometers for simple gold testing or XRF analysis in electroplating to automated high-end systems in the electronics industry. Our measuring and analysis instruments are easy to use, highly precise and extremely reliable - this is how you can measure us!

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