X-ray fluorescence

From highly flexible to highly customized, Fischer now offers three new X-ray fluorescence measurement systems

X-ray fluorescence

X-RAY XAN® 500 – the versatile XRF measurement technology

 

Characteristics

  • Mobile X-ray fluorescence device
  • Optimized for layer thickness measurement and analysis of alloys
  • Tilting protection for measurements with one hand
  • Measuring box and tablet with WinFTM software

Your advantages

  • Precise layer thickness measurement (e.g., Zn, ZnNi, Ag, Au)
  • One device – three application areas: mobile, stationary and inline
  • Measure bulky parts with high repeatability
  • Placed into the measuring box the XAN 500 turns into a full-function table-top instrument
  • Integrated into the control system of a production line, the XAN 500 carries out 100% monitoring


Compact and powerful: the XAN 500 is equipped with a tablet and the WinFTM software

X-RAY XDV®-µ LD
large measuring distance – small measuring spots

 

Characteristics

  • Universal X-ray fluorescence system ideally suited for measuring very thin and complex layer systems
  • Large measuring distance (12 mm)
  • Micro-focus tube and polycapillary optics provide for very small measurement spots
  • Special housing and an extended sample table

Your advantages

  • Measurement of samples with complex geometry, e.g. of printed circuit boards
  • Very high excitation intensity shortens the measurement time
  • Easy handling of large samples like circuit boards


Whether printed circuit boards or connectors: the XDV-µ LD is the right choice for small components with a complex geometry

X-RAY XDV®-µ LEAD FRAME – customized for the electronic industry

 

Characteristics

  • Automated layer thickness measurement and material analysis of conductor tracks, contacts or lead frames
  • Analysis in ambient air or with helium purge
  • Polycapillary optics for small measuring spots

Your advantages

  • Measurement of multi-layer systems and NiP coatings
  • Built-in helium purge allows the measurement of very light elements such as sodium
  • Also suitable for large printed circuit boards


The XDV®-µ LEAD FRAME covers a very wide range of elements – from sodium (11) to uranium (92)

 

Available from second half of 2017

Su contacto con FISCHER

Contact

Helmut Fischer S. de R.L. de C.V.
1a. de Fresnos 504, Col. Jurica
Querétaro, QRO/México
Tel.: +52 (442) 260-9295
E-mail: contacto@helmut-fischer.mx
Formulario de contacto en línea