Desktop Analysis Systems

Desktop measurement instruments for material analysis with X-ray fluorescence offer both outstanding accuracy and flexibility. And the Fischer portfolio offers the right measurement solution for a huge range of analytical tasks. Numerous advantages – from the non-destructive measurement procedure to the quick measurement times – make Fischer instruments a profitable investment.

GOLDSCOPE

The X-ray fluorescence devices of the GOLDSCOPE family are designed specifically to analyze gold and other precious metals

XAN500

One instrument, three job descriptions: not only is the flexible XAN®500 a handheld XRF device, it also converts into a desktop unit and can be integrated into production lines.

XAN

Measurement instruments for fast and cost-effective analysis of gold jewelry and other precious metals.

XDL / XDLM / XDAL

The all-rounder: with comprehensive configuration options, XDL instruments are ideal for manual measurements or serial testing of coating thicknesses and material compositions.

XDV-SDD

The FISCHERSCOPE® XDV-SDD was designed to meet the highest demands in coating thickness measurement and material analysis.

XDV-µ

With its XDV-μ series, Fischer offers instruments for testing the smallest of structures, e.g. in the electronics or jewelery industries.

XUV

X-ray fluorescence instruments with vacuum chamber for analyzing light elements.

iMOXS

Expand the functions of your atomic force microscope: the modular X-ray source iMOXS enables scanning electron microscope (SEM) and X-ray fluorescence analysis with a single device.

Your contact to FISCHER

Contact

Partner of Industrial Segments
Sigma Enterprises WLL
PO Box 15784, Alfardan Center, Grand Hamad Street, Doha
Phone: +974 44622614
E-Mail: Manuel.Ramalho@sep.qa
Online contact form

Partner of Jewelry Segment
Qatar Scientific Co WLL
PO Box 41243, Office # 511, 5th Floor Al Retaj Business Center, Rawdat Al-Khail Area B-Ring Road, Doha
Phone: +974 4462 1165
E-Mail: afifi@qsneoscience.com
Online contact form