XDL / XDLM / XDAL

With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in their X-ray source,
filter, Aperture and detector – make it possible to select the X-ray device with the configuration that best suits your specific measurement task.

XDL / XDLM / XDAL: XDL instruments are ideal for manual measurements or serial testing of coating thicknesses and material compositions

Features:

  • X-ray fluorescence instruments for a variety of measurement tasks, made possible through different hardware components
  • Also suitable for testing assembled circuit boards or parts with indentations, due to the variable measuring distance (up to 80 mm)
  • Automated serial testing with programmable XY-table and Z-axis (optional)
  • Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device)

Applications:

Coating Thickness Measurement

  • Measurement of coatings on large boards and flexible circuit boards (flex PCBs)
  • Thin conductive and/or separating layers on circuit boards
  • Coatings on three-dimensional components
  • Chrome coatings, for example plastic items with decorative chrome finish

Material Analysis

  • Analysis of electroplating baths
  • Analysis of functional coatings in the electronics and semiconductor industry
  • Analysis of hard material coatings, for example CrN, TiN or TiCN

Your contact to FISCHER

Contact

Partner of Industrial Segments
Sigma Enterprises WLL
PO Box 15784, Alfardan Center, Grand Hamad Street, Doha
Phone: +974 44622614
E-Mail: Manuel.Ramalho@sep.qa
Online contact form

Partner of Jewelry Segment
Qatar Scientific Co WLL
PO Box 41243, Office # 511, 5th Floor Al Retaj Business Center, Rawdat Al-Khail Area B-Ring Road, Doha
Phone: +974 4462 1165
E-Mail: afifi@qsneoscience.com
Online contact form

Information