Desktop Analysis Systems

Desktop measurement instruments for material analysis with X-ray fluorescence offer both outstanding accuracy and flexibility. And the Fischer portfolio offers the right measurement solution for a huge range of analytical tasks. Numerous advantages – from the non-destructive measurement procedure to the quick measurement times – make Fischer instruments a profitable investment.

GOLDSCOPE

The X-ray fluorescence devices of the GOLDSCOPE family are designed specifically to analyze gold and other precious metals

XAN500

One instrument, three job descriptions: not only is the flexible XAN®500 a handheld XRF device, it also converts into a desktop unit and can be integrated into production lines.

XAN

Measurement instruments for fast and cost-effective analysis of gold jewelry and other precious metals.

XDL / XDLM / XDAL

The all-rounder: with comprehensive configuration options, XDL instruments are ideal for manual measurements or serial testing of coating thicknesses and material compositions.

XDV-SDD

The FISCHERSCOPE® XDV-SDD was designed to meet the highest demands in coating thickness measurement and material analysis.

XDV-µ

With its XDV-μ series, Fischer offers instruments for testing the smallest of structures, e.g. in the electronics or jewelery industries.

XUV

X-ray fluorescence instruments with vacuum chamber for analyzing light elements.

iMOXS

Expand the functions of your atomic force microscope: the modular X-ray source iMOXS enables scanning electron microscope (SEM) and X-ray fluorescence analysis with a single device.

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Contact

HES1 SIA
Vilnius/Lithuania

Contact person in, Vilnius/Lithuania
Phone: +370 62053325
E-Mail: info@m-technologijos.lt
Online contact form

HES1 SIA
Piedrujas street 11, office 214, Riga/Latvia
Phone: +370 62053325
E-Mail: rytis@m-technologijos.lt