Material Analysis

X-ray fluorescence analysis instruments with outstanding precision and flexibility. The Fischer portfolio contains high-performance instruments for measurement tasks across many different sectors.

Desktop Analysis Systems

High-performance desktop instruments for material analysis by means of X-ray fluorescence.

Stationary Measurement Systems

Inline Measuring Systems

Inline measurement systems for continuous material analysis in automated production processes.

Inline Measurement Systems

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Pantechnic Ltd.
Piraeus/Greece

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3, Ag. Konstantinou Str., Piraeus/Greece
Phone: +30 (210) 4132 693
E-Mail: info@pantechnic.gr
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