X-Ray fluorescence is a highly effective tool for materials analysis. It is widely used for coating thickness measurement and is also well suited for element identification.
The samples can be evaluated in almost any dimension and condition. Powder and paste can be analyzed in the same manner as solid materials or liquids.

Fast results are possible with our X-Ray Fluorescence Testing for WEEE and RoHS compliance. The FISCHERSCOPE^® X-Ray XAN^®, XDAL^® and XDV^®-SDD series are energy dispersive high-performance X-Ray fluorescence spectrometers and provide simple, fast and accurate analysis of unknown materials. Element detection from Aluminum to Uranium is possible even at very low concentrations.

The exceptionally powerful capabilities of these unique instruments are achieved by the use of a semiconductor detector with Peltier cooling for high spectral energy resolution and the WinFTM^® Version 6 Software for materials and multi-dimensional coating analysis.

In combination with the application kit Gold Assay, these instrument series are also part of the FISCHERSCOPE® GOLDLINE ASSAY, ideally suited for the fast, non-destructive and accurate gold content measurement in jewelry and precious metals.