The COULOSCOPE^® CMS (Coulometric Measuring System) uses the coulometric method for measuring coating thickness. New design features include a large, easy to read LCD display, an intuitive menu-driven operator system, the new V18 measuring stand that allows automatic filling and emptying of the cell by pump control as well as additional SPC capabilities. The instrument is ideal for measuring the thickness of virtually any metallic coating on a metallic or non-metallic substrate, including multiple coatings. It is used in applications where non-destructive methods cannot or need not be used.

The COULOSCOPE^® CMS, accurately measures metallic coatings in the range of 0.05 - 40 µm (0.002 - 1.6 mils). The unit is capable of storing hundreds of predefined coating/substrate applications from single coatings such as zinc on steel up to triple coatings like chromium on nickel on copper on plastic. Multiple storage memories allow thousands of measurement values to be recorded and saved. An RS232 interface allows the stored data to be printed or downloaded to a PC.

Four different types of measurement stands are available for measuring various kinds of measurement objects.

Upper left image corner: The measurement stand V18 operates with a new measuring cell design. It is no longer necessary to empty the measuring cell after each measurement since the pump automatically pumps the electrolyte into a storage chamber after the measurement. Serveral measurements can be performed with one filling of the measuring cell.

Upper right image corner: The measurement stand V24 allows the flexible positioning of small parts.

Lower left image corner: The measurement stand V26 designed mainly for simple and flat shapes.

Lower right image corner: The measurement stand V27 designed specifically for measurements on wires.

COULOSCOPE^® CMS STEP

The Simultaneous Thickness and Electrochemical Potential determination of individual layers in multilayer nickel deposits becomes more and more of an important requirement in the plating industry. The preferred multilayer electrodeposits consist of a sulfer-free semibright and a sulfor-containing bright nickel layer. A sufficient potential difference between the two nickel layers causes the bright layer to corrode preferentially and sacrificially with respect to the semibright nickel. This in turn retards the rate of penetration through the total nickel deposit and gives better corrosion protection to the basis metal than a single nickel layer.

The COULOSCOPE^® CMS STEP is suited to determine layer thickness and potential difference in a very simple way by means of two cursors, positioned on the relevant parts of the potential-time graph. This graph can also be externally recorded or transferred to a PC via RS232.