COULOSCOPE® CMS STEP The
Simultaneous
Thickness and
Electrochemical
Potential determination of individual layers in multilayer nickel deposits becomes more and more of an important requirement in the plating industry. The preferred multilayer electrodeposits consist of a sulfer-free semibright and a sulfor-containing bright nickel layer. A sufficient potential difference between the two nickel layers causes the bright layer to corrode preferentially and sacrificially with respect to the semibright nickel. This in turn retards the rate of penetration through the total nickel deposit and gives better corrosion protection to the basis metal than a single nickel layer.
The COULOSCOPE
® CMS STEP is suited to determine layer thickness and potential difference in a very simple way by means of two cursors, positioned on the relevant parts of the potential-time graph. This graph can also be externally recorded or transferred to a PC via RS232.